Agilent Technologies InfiniiVision 5000 Series Programmer's Guide

318 Agilent InfiniiVision 5000 Series Oscilloscopes Programmer's Guide
5 Commands by Subsystem
:MTESt Commands
The MTESt subsystem commands and queries control the mask test
features. See "Introduction to :MTESt Commands" on page 320.
Table 54 :MTESt Commands Summary
Command Query Options and Query Returns
:MTESt:AMASk:CREate
(see page 323)
n/a n/a
:MTESt:AMASk:SOURce
<source> (see
page 324)
:MTESt:AMASk:SOURce?
(see page 324)
<source> ::= CHANnel<n>
<n> ::= {1 | 2 | 3 | 4} for 4ch
models
<n> ::= {1 | 2} for 2ch models
:MTESt:AMASk:UNITs
<units> (see
page 325)
:MTESt:AMASk:UNITs?
(see page 325)
<units> ::= {CURRent | DIVisions}
:MTESt:AMASk:XDELta
<value> (see
page 326)
:MTESt:AMASk:XDELta?
(see page 326)
<value> ::= X delta value in NR3
format
:MTESt:AMASk:YDELta
<value> (see
page 327)
:MTESt:AMASk:YDELta?
(see page 327)
<value> ::= Y delta value in NR3
format
n/a :MTESt:COUNt:FWAVefor
ms? [CHANnel<n>] (see
page 328)
<failed> ::= number of failed
waveforms in NR1 format
:MTESt:COUNt:RESet
(see page 329)
n/a n/a
n/a :MTESt:COUNt:TIME?
(see page 330)
<time> ::= elapsed seconds in NR3
format
n/a :MTESt:COUNt:WAVeform
s? (see page 331)
<count> ::= number of waveforms
in NR1 format
:MTESt:DATA <mask>
(see page 332)
:MTESt:DATA? (see
page 332)
<mask> ::= data in IEEE 488.2 #
format.
:MTESt:DELete (see
page 333)
n/a n/a
:MTESt:ENABle {{0 |
OFF} | {1 | ON}} (see
page 334)
:MTESt:ENABle? (see
page 334)
{0 | 1}
:MTESt:LOCK {{0 |
OFF} | {1 | ON}} (see
page 335)
:MTESt:LOCK? (see
page 335)
{0 | 1}

Agilent Technologies InfiniiVision 5000 Series Specifications

General

Brand	Agilent Technologies
Model	InfiniiVision 5000 Series
Category	Test Equipment
Language	English