Agilent Technologies InfiniiVision 5000 Series Programmer's Guide

Index
Agilent InfiniiVision 5000 Series Oscilloscopes Programmer's Guide 785
start time, 451, 591
start time marker, 588
state memory, 114
state of instrument, 107, 397
STATistics commands, 554
statistics increment, 300
statistics reset, 301
statistics results, 291
statistics, type of, 299
status, 117, 159, 161
Status Byte Register (STB), 115, 117, 118, 629
STATus commands, 554
status data structure clear, 101
status registers, 52
status reporting, 623
STB (Status Byte Register), 115, 117, 118, 629
step size for frequency span, 243
stop, 132, 160
stop acquisition, 160
STOP commands, 554
stop cursor, 592
stop displaying channel, 130
stop displaying math function, 130
stop displaying pod, 130
stop on mask test failure, 340
stop time, 451, 592
storage, 114
store instrument setup, 107, 114
store setup, 114
store waveforms to pixel memory, 140
storing calibration information, 182
string variables, 50
string variables, reading multiple query results
into, 51
string variables, reading query results into
multiple, 51
string, quoted ASCII, 93
subnet mask, 33
subsource, waveform source, 525
subsystem commands, 96, 675
subtract math function, 230, 237, 521
subtract math function as g(t) source, 233
sweep mode, trigger, 411, 421
sweep speed set to fast to measure fall
time, 282
sweep speed set to fast to measure rise
time, 294
switch disable, 395
switch, calibration protect, 186
sync break, LIN, 468
syntax elements, 92
syntax rules, program data, 662
syntax, optional terms, 92
syntax, program message, 659
SYSTem commands, 391
system commands, 392, 393, 394, 395, 397,
399
system commands introduction, 391
T
tdelta, 587
tedge, 302
telnet ports 5024 and 5025, 509
Telnet sockets, 53
temporary message, 393
TER (Trigger Event Register), 161, 632
termination conditions, mask test, 337
test sigma, mask test run, 341
test, self, 120
text, writing to display, 393
threshold voltage (lower) for
measurement, 585
threshold voltage (upper) for
measurement, 595
thresholds, 277, 588
thresholds used to measure period, 287
thresholds, how autoscale affects, 126
TIFF image format, 363
time base, 402, 403, 404, 405, 406, 609
time base commands introduction, 400
time base reset conditions, 111
time base window, 408, 409, 410
time between points, 587
time buckets, 166, 167
TIME commands, 555
time delay, 609
time delta, 587
time difference between data points, 529
time duration, 434, 435, 438, 451
time holdoff for trigger, 416
time interval, 302, 304, 587
time interval between trigger and
occurrence, 593
time marker sets start time, 588
time per division, 404
time record, 244
time specified, 314
time, calibration, 188
time, mask test run, 342
time, start marker, 591
time, stop marker, 592
time, system, 399
time/div, how autoscale affects, 126
time-at-max measurement, 589
time-at-min measurement, 590
TIMebase commands, 400
timebase vernier, 407
TIMebase:MODE, 48
time-ordered label list, 214
timeout, 472
timing measurement, 272
title channels, 197
title, mask test, 350
tolerance, automask, 326, 327
top of waveform value measured, 315
total frame count (CAN), 378
total waveforms in mask test, 331
trace memories, how autoscale affects, 126
trace memory, 159, 162
trace memory data, 211
track measurements, 296
trademarks, 2
transfer instrument state, 107, 397
transmit, 211
tree traversal rules, 675
tree, command, 663
TRG (Trigger), 116, 118, 119
TRIG OUT BNC, 183
trigger (external) input impedance, 221, 574
trigger armed event register, 147, 149
trigger burst, UART, 490
TRIGger CAN commands, 422
trigger channel source, 452, 483
TRIGger commands, 411, 556
TRIGger commands, general, 414
trigger data, UART, 491
trigger duration, 434, 435
TRIGger DURation commands, 433
TRIGger EDGE commands, 439
trigger edge coupling, 440
trigger edge slope, 443
trigger event bit, 161
Trigger Event Register (TER), 632
TRIGger GLITch commands, 445
trigger holdoff, 416
trigger idle, UART, 492
TRIGger IIC commands, 453
trigger level constants, 199
trigger level voltage, 441
TRIGger LIN commands, 462
trigger occurred, 118
trigger pattern, 419, 436
trigger qualifier, 437
trigger qualifier, UART, 495
trigger reset conditions, 111
trigger SPI clock slope, 471
TRIGger SPI commands, 470
trigger status bit, 161
trigger sweep mode, 411
TRIGger TV commands, 479
trigger type, UART, 498
TRIGger UART commands, 485
trigger, CAN, 431
trigger, CAN acknowledge, 610
trigger, CAN pattern data, 424
trigger, CAN pattern data length, 425
trigger, CAN pattern ID, 426
trigger, CAN pattern ID mode, 427
trigger, CAN sample point, 428
trigger, CAN signal baudrate, 429
trigger, CAN signal definition, 611
trigger, CAN source, 430
trigger, duration greater than, 434
trigger, duration less than, 435
trigger, duration pattern, 436
trigger, duration qualifier, 437
trigger, duration range, 438
trigger, edge coupling, 440
trigger, edge level, 441
trigger, edge reject, 442
trigger, edge slope, 443
trigger, edge source, 444
trigger, glitch greater than, 446
trigger, glitch less than, 447
trigger, glitch level, 448

Agilent Technologies InfiniiVision 5000 Series Specifications

General

Brand	Agilent Technologies
Model	InfiniiVision 5000 Series
Category	Test Equipment
Language	English