NXP Semiconductors KL25 Series - Freescale Semiconductor, Inc

TSIx_GENCS field descriptions (continued)
Field Description
010 Electrode Oscillator Frequency divided by 4
011 Electrode Oscillator Frequency divided by 8
100 Electrode Oscillator Frequency divided by 16
101 Electrode Oscillator Frequency divided by 32
110 Electrode Oscillator Frequency divided by 64
111 Electrode Oscillator Frequency divided by 128
12–8
NSCN
NSCN
These bits indicate the scan number for each electrode. The scan number is equal to NSCN + 1, which
allows the scan time ranges from 1 to 32. By default, NSCN is configured as 0, which asserts the TSI
scans once on the selected eletrode channel.
00000 Once per electrode
00001 Twice per electrode
00010 3 times per electrode
00011 4 times per electrode
00100 5 times per electrode
00101 6 times per electrode
00110 7 times per electrode
00111 8 times per electrode
01000 9 times per electrode
01001 10 times per electrode
01010 11 times per electrode
01011 12 times per electrode
01100 13 times per electrode
01101 14 times per electrode
01110 15 times per electrode
01111 16 times per electrode
10000 17 times per electrode
10001 18 times per electrode
10010 19 times per electrode
10011 20 times per electrode
10100 21 times per electrode
10101 22 times per electrode
10110 23 times per electrode
10111 24 times per electrode
11000 25 times per electrode
11001 26 times per electrode
11010 27 times per electrode
11011 28 times per electrode
11100 29 times per electrode
11101 30 times per electrode
11110 31 times per electrode
11111 32 times per electrode
7
TSIEN
Touch Sensing Input Module Enable
This bit enables TSI module.
Table continues on the next page...
Register definition
KL25 Sub-Family Reference Manual, Rev. 3, September 2012
790 Freescale Semiconductor, Inc.