Agilent Technologies InfiniiVision 5000 Series Programmer's Guide

782 Agilent InfiniiVision 5000 Series Oscilloscopes Programmer's Guide
Index
measurement source, 297
measurement statistics results, 291
measurements, average value, 307
measurements, base value, 308
measurements, built-in, 43
measurements, clear, 274, 586
measurements, command overview, 272
measurements, counter, 275
measurements, dc RMS, 313
measurements, definition setup, 277
measurements, delay, 279
measurements, duty cycle, 281
measurements, fall time, 282
measurements, frequency, 283
measurements, how autoscale affects, 126
measurements, lower threshold level, 585
measurements, maximum vertical value, 309
measurements, maximum vertical value, time
of, 316, 589
measurements, minimum vertical value, 310
measurements, minimum vertical value, time
of, 317, 590
measurements, overshoot, 285
measurements, period, 287
measurements, phase, 288
measurements, preshoot, 289
measurements, pulse width, negative, 284
measurements, pulse width, positive, 290
measurements, ratio of AC RMS values, 312
measurements, resetting, 131
measurements, rise time, 294
measurements, show, 296
measurements, source channel, 297
measurements, standard deviation, 295
measurements, start marker time, 591
measurements, stop marker time, 592
measurements, thresholds, 588
measurements, time between start and stop
markers, 587
measurements, time between trigger and
edge, 302
measurements, time between trigger and
vertical value, 304
measurements, time between trigger and
voltage level, 593
measurements, upper threshold value, 595
measurements, vertical amplitude, 306
measurements, vertical peak-to-peak, 311
measurements, voltage difference, 596
memory setup, 114, 397
merge, 140
message available bit, 118
message available bit clear, 101
message displayed, 118
message error, 615
message queue, 634
messages ready, 118
midpoint of thresholds, 287
minimum duration, 434, 435, 438, 446
minimum vertical value measurement, 310
minimum vertical value, time of, 317, 590
mnemonics, duplicate, 674
mode, 169, 177, 258, 402, 481
MODE commands, 546
mode, serial decode, 383
model number, 106
models, oscilloscope, 3
modes for triggering, 417
Modify softkey, 34
monochrome palette for image, 365
most significant byte first, 507
move, 230
move cursors, 591, 592
msbfirst, 507
MSG (Message), 116, 118
MSS (Master Summary Status), 118
MTEenable (Mask Test Event Enable
Register), 141
MTERegister[:EVENt] (Mask Test Event Event
Register), 143, 644
MTESt commands, 318
multiple commands, 675
multiple queries, 51
multiply math function, 230, 237, 521
multiply math function as g(t) source, 233
N
name channels, 197
name list, 214
negative glitch trigger polarity, 449
negative pulse width, 284
negative pulse width measurement, 43
negative slope, 443, 471
negative TV trigger polarity, 482
new line (NL) terminator, 92, 660
NL (new line) terminator, 92, 660
noise reject filter, 418
non-core commands, 658
non-interlaced GENeric mode, 484
non-volatile memory, label list, 214
normal acquisition type, 163, 502
normal trigger sweep mode, 411
notices, 2
NR1 number format, 92
NR3 number format, 92
NTSC, 480, 484
NULL string, 393
number format, 92
number of points, 170, 512, 514
number of time buckets, 512, 514
numeric variables, 50
numeric variables, reading query results into
multiple, 52
nwidth, 284
O
obsolete and discontinued commands, 563
obsolete commands, 658
occurrence reported by magnitude, 593
offset, 230
OFFSet commands, 547
offset value for channel voltage, 198
offset value for selected function, 236, 239
one values in waveform data, 509
OPC (Operation Complete) command, 108
OPC (Operation Complete) status bit, 103, 105
OPEE (Operation Status Enable Register), 145
Open method, 45
operating configuration, 107, 397
operating state, 114
OPERation commands, 548
operation complete, 108
operation status condition register, 147
Operation Status Condition Register
(:OPERegister:CONDition), 147, 639
operation status conditions occurred, 118
Operation Status Enable Register (OPEE), 145
operation status event register, 149
Operation Status Event Register
(:OPERegister[:EVENt]), 149, 638
operation, math, 230
operations for function, 237
OPERegister:CONDition (Operation Status
Condition Register), 147, 639
OPERegister[:EVENt] (Operation Status Event
Register), 149, 638
OPT (Option Identification), 109
optional syntax terms, 92
options, 109
order of output, 507
oscilloscope connection, opening, 45
oscilloscope connection, verifying, 35
oscilloscope external trigger, 218
oscilloscope models, 3
oscilloscope rate, 176
oscilloscope, connecting, 33
oscilloscope, initialization, 42
oscilloscope, operation, 4
oscilloscope, program structure, 42
oscilloscope, setting up, 33
oscilloscope, setup, 46
OUTPut commands, 548
output messages ready, 118
output queue, 108, 633
output queue clear, 101
output sequence, 507
output, mask test, 336
overlapped commands, 678
overload, 203, 225
Overload Event Enable Register (OVL), 151
Overload Event Register (:OVLRegister), 641
Overload Event Register (OVLR), 153
overload frame count (CAN), 376
overload protection, 151, 153
overshoot of waveform, 285
overvoltage, 203, 225
OVL (Overload Event Enable Register), 151
OVLR (Overload Event Register), 153
OVLR bit, 138, 147, 149
OVLRegister (Overload Event Register), 641

Agilent Technologies InfiniiVision 5000 Series Specifications

General

Brand	Agilent Technologies
Model	InfiniiVision 5000 Series
Category	Test Equipment
Language	English