D: Using a Model 82 C-V System Model 4200A-SCS Parameter Analyzer
D-34 4200A-901-01 Rev. C / February 2017
Details
This method can be used for minority carrier lifetime measurements using Zerbst plot.
The figure below shows the default parameters for the ctsweep UTM, which uses the CtSweep82
user module. In this example, the Model 82 is set to first stress the DUT at +3 V for three seconds,
and then perform 100 capacitance measurements at −3 V using a 0.1 s time interval (see
CtSweep
test description (on page D-19)). For details on C-t measurements, refer to C-t sweep (on page D-18).
Figure 605: CtSweep82 user module
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