6: Clarius Model 4200A-SCS Parameter Analyzer
6-336 4200A-901-01 Rev. C / February 2017
Testing flash memory
Clarius includes several projects that you can use to test floating gate transistors (NOR, NAND) and
other types of nonvolatile memory.
To use the flash memory tests, you will need:
• Two pulse cards (four pulse channels).
• At least two SMUs. If your system does not include switching, it is best to have four SMUs to
match the number of pulse channels to connect to a three- or four-terminal device. Either 4200-
SMUs or 4210-SMUs with SMU preamplifiers removed can be used.
• Interconnecting cables and adapters, shown in the table below.
• 8 in. lb. torque wrench for tightening the SMA connections.
Figure 392: Recommended parts for flash memory testing
Recommended interconnect parts for flash memory testing
Qty. Description Comment
Keithley Model
Number
SMA tee, female – male – female
Trigger, combine SMU and pulse channels
LEMO triaxial to SMA adapter
Adapt SMU Force output to SMA for signal
interconnect
3-slot male triaxial to female BNC adapter
Convert BNC cabling to triaxial for prober
or switch matrix connection
SMA male to BNC female adapter
Adapt Tee to BNC for cabling from
instrument to probe manipulators
10.8 cm (4.25 in.) white SMA cables
Interconnect for triggering
4 20.3 cm (8 in.) white SMA cables
Interconnect between pulse card and SMU
CA-452A
2 m (6.6 ft) white SMA cables
Connect to probe manipulators
This configuration permits independent source and measure for each terminal in a typical 4-terminal
floating gate transistor.
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