Keithley 4200A-SCS - BJT I-V and C-V Tests Using 4200 A-CVIV Multi-Switch Project (Cvu-Bjt-CVIV)

Section
4: Multi-frequency capacitance-voltage unit Model 4200A-SCS Parameter Analyzer
Reference Manual
4-42 4200A-901-01 Rev. C / February 2017
BJT I-V and C-V Tests Using 4200A-CVIV Multi-Switch Project
(cvu-bjt-cviv)
This project has test modules that measure the capacitance as a function of time at 0 V between the
terminals of a BJT: collector-base, collector-emitter, and base-emitter. You can measure this
capacitance at 0 V or as a function of an applied voltage. The 4200A-CVIV switches the CVU to the
BJT terminals.
This project includes several actions that perform CVU connection compensation through the 4200A-
CVIV Multi-Switch using a user-defined configuration. They are:
• CVU Connection Compensation Using 4200A-CVIV (cvu-cviv-comp-collect-cb)
• CVU Connection Compensation Using 4200A-CVIV (cvu-cviv-comp-collect-ce)
• CVU Connection Compensation Using 4200A-CVIV (cvu-cviv-comp-collect-be)
The project also contains the following actions and tests:
• 4200A-CVIV Configure (cviv-configure-collector-base): Uses the 4200A-CVIV Multi-Switch to
connect SMUs and the CVU to a device.
• BJT Capacitance collector-base (c-cb0): This test measures the capacitance as a function of time
between the collector and base terminals of a BJT at 0 V. The results (C versus t) are then
plotted on a graph. This test also calculates the average capacitance and standard deviation.
• 4200A-CVIV Configure (cviv-configure-collector-emitter): This action uses the 4200A-CVIV Multi-
Switch to connect SMUs and the CVU to a device.
• BJT Capacitance collector-emitter (c-ce0): This test measures the capacitance as a function of
time between the collector and emitter terminals of a BJT at 0 V. The results (C versus t) are
plotted on a graph. This test also calculates the average capacitance and standard deviation.
• 4200A-CVIV Configure (cviv-configure-base-emitter): This action uses the 4200A-CVIV Multi-
Switch to connect SMUs and the CVU to a device.
• BJT Capacitance base-emitter (c-be0): This test measures the capacitance as a function of time
between the base and emitter terminals of a BJT at 0 V. The results (C versus t) are plotted on a
graph. This test also calculates the average capacitance and standard deviation.
For additional information on using the 4200A-CVIV, refer to Application Note: Making C-V and I-V
Measurements Using the 4200A-CVIV Multi-Switch and 4200A-SCS Parameter Analyzer.