-SCS Parameter Analyzer Reference Manual Section 6:
4200A-901-01 Rev. C / February 2017 6-335
Resistor tests
The following tests use two SMUs. It is also possible to use one SMU and the GNDU.
Descriptions of the 2-wire resistor tests
Calculates the average resistance from an I-V sweep of sourcing voltage and measuring
current. This test uses two SMUs on either side of the resistor. You can also use one
SMU and GNDU if set properly in the Configure pane.
The resistor is connected between one channel of the PMU and the PMU ground.
Applies a pulse voltage sweep to the resistor during the test while the current is
Diode tests
Descriptions of the diode tests
While a forward-bias voltage sweep is applied to a diode, this test measures the anode
current and plots the data on a semi-log scale. A linear line fit is used to derive the slope
Sweeps the reverse bias voltage and measures the resulting current of a diode. This test
uses two SMUs on either side of the diode. You can also use one SMU and GNDU if
they are set properly in the Configure pane. For very low current measurements, it is
recommended that you use a SMU with the preamp option.
Measures the junction capacitance as a function of an applied voltage sweep. The
depletion depth (W) and the doping density (N) are calculated as a function of the C-V
Applies a pulse voltage sweep to the anode of a diode and measures the resulting
anode current. A single channel of the PMU is used to make the measurement.
Capacitor tests
Descriptions of the capacitor tests
Charges a capacitor at a constant current and measures the voltage as a function of
time.
Measures the capacitance as a function of time on a capacitor. The noise is calculated
using the standard deviation of the data.
Applies a single voltage pulse to a capacitor and measures the resulting current. A single
channel of the PMU is used to make the measurement. One end of the capacitor is
connected to PMU1 and the other end is connected to PMU GND.
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