Keithley 4200A-SCS

Model 4200A
-SCS Parameter Analyzer Reference Manual Appendix D: Using a Model 82 C-
V System
4200A-901-01 Rev. C / February 2017 D-47
Simultaneous C-V analysis
This section discusses the theory and techniques used in the various Keithley Instruments
Simultaneous C-V libraries. For more detailed discussions, refer to the
References and bibliography
of C-V measurements (on page D-65).
Analysis methods
The following figures show fundamental C-V curves for p-type and n-type materials. Both high-
frequency and quasistatic curves are shown in these figures. Note that the high-frequency curves are
highly asymmetrical, while the quasistatic curves are almost symmetrical. Accumulation, depletion,
and inversion regions are also shown on the curves. The gate-biasing polarity and high-frequency
curve shape can be used to determine device type, as shown below.
Figure 610: C-V characteristics of p-type material
Figure 611: C-V characteristics of n-type material