4: Multi-frequency capacitance-voltage unit Model 4200A-SCS Parameter Analyzer
4-38 4200A-901-01 Rev. C / February 2017
cv-capacitor test
This test applies a DC bias voltage to a capacitor and measures capacitance as a function of time. It
generates a capacitance versus time graph and calculates average capacitance and standard
deviation.
Analyze sheet
The test data is displayed in the Analyze sheet:
• Time: Timestamp for each measurement.
• Cp_AB: Measured parallel capacitance.
• Gp_AB: Measured conductance.
• DCV_AB: Forced DC bias voltage.
• F_AB: Forced test frequency.
• CVU1S: Status code for each measurement. For details, see Measurement status (on page 6-
191).
• AVG_CAP: Formulator calculation result.
• STD_DEV: Formulator calculation result.
AB = Terminal A to Terminal B.
BJT Capacitance Tests (cvu-bjt)
The internal capacitance measurements on bipolar junction Transistors (BJTs) can affect the gain
and frequency response of devices. This project includes test modules that measure the capacitance
as a function of time at 0 V between the terminals of a BJT. Measurements are made between the
collector-base, collector-emitter, and base-emitter. You can measure capacitance at 0 V or as a
function of an applied voltage that you specify.
This project includes the following tests:
• c-cb0: Measures the capacitance as a function of time between the collector and base.
• c-ce0: Measures the capacitance as a function of time between the collector and emitter.
• c-be0: Measures the capacitance as a function of time between the base and emitter.
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