Keithley 4200A-SCS

Model 4200A
-SCS Parameter Analyzer Reference Manual Appendix L: Wafer-
level reliability testing
4200A-901-01 Rev. C / February 2017 L-5
Negative Bias Temperature Instability project
The Negative Bias Temperature Instability (nbti-1-dut) project performs NBTI testing on a p-
MOSFET with temperature and DC stress. The following figure shows the project tree when the
nbti-1-dut project is selected.
Figure 831: Project tree for nbti-1-dut