In this appendix:
Introduction ............................................................................... E-1
Using KCon to add a Keysight pulse generator to the system .. E-4
HP8110ulib user library ............................................................ E-4
Introduction
For details on all aspects of the HP pulse generator operation, refer to the Keysight Model 8110A
User’s Manual.
The 4200A-SCS can control a Keysight Model 8110A Pulse Generator to output from 1 to 65,535
pulses. The figure below shows an example pulse output. Timing parameters that can be set for the
output pulse include pulse delay time, pulse width, pulse period, pulse rise time, and pulse fall time.
Details on all parameters for the output pulse are provided in HP8110ulib user library (on page
6-
311).
One of the applications for a pulse generator in a semiconductor characterization test system is
stress testing. The stress is a burst of pulses applied by the pulse generator to a semiconductor
device, such as a flash memory cell. The 4200A-SCS performs before-stress and after-stress
characterization tests on the device.
Figure 614: Pulse generator output example
Pulse generator tests
The 4200A-SCS includes the following user modules to run tests using a Keysight pulse generator:
• PguInit8110: Initialization: Disables the pulse generator output and returns it to a default setup
configuration.
• PguSetup8110: Set up pulse: Used to define the output pulse.
• PguTrigger8110: Trigger output: Used to specify the number of pulses and trigger the pulse
output process.
Details on the user modules for the Keysight pulse generator library are in HP8110ulib user library
(on page 6-311).
Appendix E
Using a Keysight 8110A/8111A Pulse Generator
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