-SCS Parameter Analyzer Reference Manual Section 4: Multi-frequency capacitance-
4200A-901-01 Rev. C / February 2017 4-43
High-Voltage C-V Tests Project (cvu-highv)
This project contains tests for making high-voltage C-V measurements on a Zener diode, MOS
capacitor, capacitor, and a Schottky diode. These tests use the CVU, SMU, and the 4205-RBT
remote bias tee. The CVU measures the capacitance, the SMU supplies the DC bias, and the
4205-RBT bias tee couples the AC and DC signal.
The 4205-RBT is included in the 4200-CVU-PWR C-V Power Package.
The tests in this project include:
• Zener Diode High-Voltage C-V Sweep (hvcv-zener): Enables high-voltage C-V measurements on
a Zener diode using the CVU, SMU, and 4205-RBT remote bias tee.
• MOS Capacitor High-Voltage C-V Sweep (hvcv-moscap): Enables a high-voltage C-V sweep on a
MOS capacitor using the CVU, SMU, and the 4205-RBT remote bias tee.
• Capacitor High-Voltage Bias Capacitance Measurements (200vbias): Makes a high-voltage C-V
measurement on a capacitor using the CVU, SMU, and the 4205-RBT remote bias tee.
• Capacitor High-Voltage C-V Sweep (200vsweep): This test enables a high-voltage C-V sweep on
a capacitor using the CVU, SMU, and the 4205-RBT remote bias tee.
• Schottky Capacitor 400 V C-V Sweep (400vsweep): This test enables a high-voltage C-V sweep
on a Schottky diode using the CVU, SMU, and the 4205-RBT remote bias tee.
For additional information on high-voltage measurements, refer to Application Note 2972: Using the
Model 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V
Measurements.
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