-SCS Parameter Analyzer Reference Manual Section 4: Multi-frequency capacitance-
4200A-901-01 Rev. C / February 2017 4-41
c-ce0 test
This test measures the capacitance as a function of time between the collector and emitter terminals
of a BJT at 0 V. The results (C versus t) are plotted on a graph. This test also calculates the average
capacitance and standard deviation.
Analyze sheet
Test data is displayed in the Analyze sheet:
• Time: Timestamp for each measurement.
• Cp_CE: Measured parallel capacitance.
• Gp_CE: Measured conductance.
• DCV_CE: Forced DC bias voltage.
• F_CE: Forced test frequency.
• CVU1S: Status code for each measurement. Rows highlighted in blue indicate a fault. For details,
see Measurement status (on page 6-191
).
• STD_DEV: Calculated value; the standard deviation of the capacitance measurements.
• AVG_CAP: Calculated value; the average capacitance in farads (F).
c-be0 test
This test measures the capacitance as a function of time between the base and emitter terminals of a
BJT at 0 V. The results (C versus t) are plotted on a graph. This test also calculates the average
capacitance and standard deviation.
Analyze sheet
Test data is displayed in the Analyze sheet:
• Time: Timestamp for each measurement.
• Cp_BE: Measured parallel capacitance.
• Gp_BE: Measured conductance.
• DCV_BE: Forced DC bias voltage.
• F_BE: Forced test frequency.
• CVU1S: Status code for each measurement. Rows highlighted in blue indicate a fault. For details,
see Measurement status (on page 6-191
).
• AVG_CAP: Calculated value; the average capacitance in farads (F).
• STD_DEV: Calculated value; the standard deviation of the capacitance measurements.
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