F: Set up a probe station Model 4200A-SCS Parameter Analyzer
F-18 4200A-901-01 Rev. C / February 2017
7. The action connect connects the SMUs to the probes for the npn transistor as shown in the
following figure.
Figure 632: Connect SMUs to NPN transistor
8. The test runs vce-ic-1x, which generates a collector family of curves (I
C
vs. V
C
) for the
transistor.
9. The action prober-ss-move moves the prober to the next subsite.
10. The tests continue with subsite2 and subsite3.
11. After all the subsites have run, the action prober-separate separates the prober pins from the
wafer.
12. The action prober-prompt displays the message “Wafer Test Complete” at the end of the test.