Keithley 4200A-SCS

Index
Model 4200A-SCS Parameter Analyzer
Reference Manual
Index-2 4200A-901-01 Rev. C / February 2017
actions, link • 6-150
Add
a legend • 6-235
add device to library • 6-320
Add subsite • 6-153
add_mode subcommand (KULT) • 8-57
analysis formula to the ITM or UTM • 6-291
comment • 6-232
connection • 13-213
custom ITM • 6-116
new UTM • 8-27
probe station • A-27
prober • G-28, H-21, I-5
subsite • 6-153
subsites • 6-153
switching system mainframe • A-29
test fixture • A-26
title, legend, or comment to graph • 6-237
Added and executed regression formula for the
plateau • 6-291
adelay • 13-65, 13-178
Aligning wafer • G-18
analysis results • 6-292
Analyze data • 6-198
arb_array • 13-140
arb_file • 13-141
asweepX • 13-65, 13-179
Auto Calibration • 12-5
Average • 13-68
average pulses • 5-5
AVMControl user library • 6-327
B
backup and restore software • 11-4
Basic
ground unit characteristics • 2-8
SMU source-measure configuration • 2-14
Basic characteristics • 1-4, 3-23, 4-1
Basic circuit configurations • 3-24
Basic PMU connection schemes • 5-14, 5-15
bias function timing • 4-5
bias-neg test • 4-81
bias-pos test • 4-80
Binary Search Measurement • 13-43
bitmap image, UI (KULT) • 6-122
BJT Capacitance Tests (cvu-bjt) • 4-41
BJT I-V and C-V Tests Using 4200A-CVIV Multi-
Switch Project • 4-45
bld_lib subcommand (KULT) • 8-59
block diagram • D-1
Block Measure • 13-69
Breakdown Sweep • 13-71
build tab area (KULT) • 8-8
Building a project • 6-9
bulk oxide charge • 4-66
C
c-2vsv-solarcell test • 4-104
cable • 2-17, 3-13, A-7
capacitance • 12-15
compensation • B-4, D-5
dialog boxes • B-9, D-13
example • B-6
tests • D-10
length • 5-11
CableCompensate590 user module • B-9, B-13, B-
34, B-37
CableCompensate82 user module • D-13
cables, recommended • 2-18, 2-22
Calc worksheet • 6-294
Calc worksheet functions • 6-294
calculate die sizes • H-17
calculation type example • 6-289
calibrate the system • 12-5
Capacitance measurement tests • B-2, C-2, D-2
capacitance tests • D-14
Capacitor I-V and C-V Measurements with Series
700 Project (cap-iv-cv-matrix) • 4-36
cap-iv-cv-matrix project • 4-38
cap-iv-cv-switch • 4-36
cap-measurements • 4-74
Card properties window • A-32
c-be0 test • 4-44
c-cb0 test • 4-43
c-ce0 test • 4-43
cf-1o pF test • 4-75
cfsweep test • 4-104
Chassis ground • 3-27
CheckBox control (KULT) • 6-131
Chuck movement • F-8
chuck navigator, align wafer • G-16, G-20
Clarius
add device to library • 6-320
Building a project • 6-9
chuck movement • F-8
Clarius interface • 6-2
Defining an ITM • 6-13
delete objects in project tree • 6-12
display and analyze project results
Analyzing test data using the Formulator