6: Clarius Model 4200A-SCS Parameter Analyzer
6-188 4200A-901-01 Rev. C / February 2017
Terminal Settings pane (Analyze)
When Analyze is selected, the Terminal Settings pane displays the settings for the presently selected
test. For information on what settings are available, refer to Test and terminal setting descriptions
(on
page 6-22).
Subsite cycling Analyze sheets
Spreadsheet data for the subsite is acquired in the Analyze sheet for the subsite.
To display subsite data:
1. In the project tree, select the subsite.
2. Select Analyze.
Stress/measure mode Analyze sheet
The following figure shows an example sheet for a subsite that has one device. Analyze spreadsheet
columns include:
• Column A: The cycles that were run.
• Column B: The stress times (in seconds) for all cycles. The stress for the first cycle is 0.0
seconds. This is the no-stress cycle for HCI testing.
• Column C: The measured readings for the first output value, I
DOFF
reading for the ID#1 test.
• Column D: Starting with the second cycle, lists the percent change between each post-stress
I
DOFF
reading and the pre-stress I
DOFF
reading in the first cycle. The percent change value is
calculated as:
% Change = ABS[(Post-Stress Rdg − Pre-Stress Rdg) / Pre-Stress Rdg x 100]
For the example in the following figure, percent change I
DOFF
for the second cycle is calculated as:
% Change I
DOFF
ABS[(82.2013e-15 − 291.1666e-15) / 291.1666e-15 x 100]
ABS[−208.9653e-15 / 291.1666e-15 x 100]
ABS[−0.7176 x 100]
• Column E: The target value that was assigned to the output value in the Subsite Stress
Properties. A target value of 0.0 indicates that the target for I
DOFF
is disabled. A target is reached
when the % change value equals or exceeds the target value.
• Starting with Column F, every three columns provide readings for another output value, the
percent change, and the target value.
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