L: Wafer-level reliability testing Model 4200A-SCS Parameter Analyzer
L-18 4200A-901-01 Rev. C / February 2017
Notes on output variables
test_status:
• 0: No test errors (exit due to measured voltage < factor of the previous value).
• 1: Failed pre-stress test.
• -2: Cumulative charge limit reached.
• -3: Maximum time limit reached.
• -4: Masked Catastrophic Failure.
• -5: Non-Catastrophic Failure.
• -6: Invalid specified t_step.
Invalid Test Result - Result = 1e21.
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