4: Multi-frequency capacitance-voltage unit Model 4200A-SCS Parameter Analyzer
4-90 4200A-901-01 Rev. C / February 2017
diode-project connections
The next figure shows the basic test configuration. Refer to Test connections for a probe card (on
page 4-7) for the connections to a semiconductor wafer.
Use only the supplied (red) 100 Ω SMA cables for connections to the 4210-CVU. Be sure that all SMA
cables that are used in the setup are the same length.
After making or changing connections, be sure to use the Confidence Check diagnostic tool and do
connection compensation tests. Refer to Confidence Check (on page 4-19) and Connection
compensation (on page 4-10) for details.
Figure 139: Basic configuration to test a semiconductor junction
diode project formulas and constants
Formulas and user-defined constants that are used for the tests are listed in the next topics. The
formulas and constants are set from the Formulator for each test.
Formula: DEPTH
Formula name: DEPTH (W)
Units: cm
Description: Width of depletion (junction) region.
Formulator entry:
DEPTH = (ES*AREA)/(CP_AC)
Simplified equation:
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