Agilent Technologies InfiniiVision 5000 Series Programmer's Guide

Index
Agilent InfiniiVision 5000 Series Oscilloscopes Programmer's Guide 779
DDE (Device Dependent Error) status bit, 103,
105
decision chart, status reporting, 646
default conditions, 111
define channel labels, 197
define glitch trigger, 450
define measurement, 277
define measurement source, 297
define trigger, 419, 434, 435, 436, 438, 451
defined as, 92
definite-length block query response, 50
definite-length block response data, 93
DELay commands, 539
delay measured to calculate phase, 288
delay measurement, 277
delay measurements, 302
delay parameters for measurement, 279
delay, how autoscale affects, 126
delayed time base, 402
delayed time base mode, how autoscale
affects, 126
delayed window horizontal scale, 410
delete mask, 333
delta time, 587
delta voltage measurement, 596
delta X cursor, 257
delta Y cursor, 257
DeskJet, 579
destination, 216
detecting probe types, 571, 575
device for hardcopy, 579
device-defined error queue clear, 101
differential signal type, 202, 224
differentiate math function, 168, 230, 237, 521
DIFFerentiate source for function, 242, 576
digital channel data, 502
digital channel labels, 214
digital pod, stop displaying, 130
digitize channels, 132
DIGitize command, 43, 47
digits, 93
disable anti-alias mode, 168
disable front panel, 395
disable function, 577
disabling calibration, 186
disabling channel display, 194
disabling status register bits, 102, 115
discontinued and obsolete commands, 563
display clear, 210
DISPlay commands, 208, 540
display commands introduction, 208
display connect, 572
display data, 211
display date, 392
display factors scaling, 199
display for channels, 194
display frequency span, 243
display measurements, 272, 296
display persistence, 215
display reference, 403, 405
display reset conditions, 111
display serial number, 157
display source, 216
display vectors, 217
display, clearing, 131
display, oscilloscope, 215, 216, 217, 232, 393
display, serial decode bus, 380
displaying a baseline, 421
displaying unsynchronized signal, 421
DNS IP, 33
domain, 33
Domain softkey, 34
driver, printer, 584
duplicate mnemonics, 674
duration, 434, 435, 438
duration for glitch trigger, 446, 447, 451
duration pattern, 436
duration qualifier, trigger, 434, 435, 437
DURation trigger commands, 433
duration triggering, 411
duty cycle measurement, 43, 272, 281
E
edge coupling, 440
edge define, 419
edge fall time, 282
edge parameter for delay measurement, 279
edge preshoot measured, 289
edge rise time, 294
edge slope, 443
edge source, 444
EDGE trigger commands, 439
edge triggering, 411
edges in measurement, 277
elapsed time in mask test, 330
ellipsis, 93
enable channel labels, 213
enabling calibration, 186
enabling channel display, 194
enabling status register bits, 102, 115
end of string (EOS) terminator, 660
end of text (EOT) terminator, 660
end or identify (EOI), 660
enter pattern, 419
EOI (end or identify), 660
EOS (end of string) terminator, 660
EOT (end of text) terminator, 660
Epson, 579
equivalent-time acquisition mode, 164, 169
erase data, 131, 210
erase functions, 131
erase measurements, 586
erase screen, 573
ERRor commands, 540
error frame count (CAN), 375
error frame count (UART), 386
error messages, 394, 615
error number, 394
error queue, 394, 637
error, measurement, 272
ESB (Event Status Bit), 116, 118
ESE (Standard Event Status Enable
Register), 102, 636
ESR (Standard Event Status Register), 104, 635
EVENt commands, 540
event status conditions occurred, 118
Event Status Enable Register (ESE), 102, 636
Event Status Register (ESR), 104, 161, 635
example code, *RST, 113
example code, :ACQuire:COMPlete, 166
example code, :ACQuire:SEGMented, 173
example code, :ACQuire:TYPE, 178
example code, :AUToscale, 127
example code, :CHANnel:LABel, 197
example code, :CHANnel:PROBe, 199
example code, :CHANnel:RANGe, 204
example code, :DIGitize, 132
example code, :DISPlay:DATA, 212
example code, :DISPlay:LABel, 213
example code, :MEASure:PERiod, 297
example code, :MEASure:RESults, 291
example code, :MEASure:TEDGe, 303
example code, :MTESt, 320
example code, :RUN/:STOP, 156
example code, :SYSTem:SETup, 397
example code, :TIMebase:DELay, 609
example code, :TIMebase:MODE, 402
example code, :TIMebase:RANGe, 404
example code, :TIMebase:REFerence, 405
example code, :TRIGger:MODE, 417
example code, :TRIGger:SLOPe, 443
example code, :TRIGger:SOURce, 444
example code, :VIEW and :BLANk, 162
example code, :WAVeform, 521
example code, :WAVeform:DATA, 509
example code, :WAVeform:POINts, 513
example code, :WAVeform:PREamble, 517
example code, :WAVeform:SEGMented, 173
example programs, 4, 679
EXE (Execution Error) status bit, 103, 105
execution error detected in Standard Event
Status, 105
exponential notation, 92
external glitch trigger source, 452
external range, 226
external trigger, 218, 221, 222, 444, 574
EXTernal trigger commands, 218
external trigger input impedance, 221, 574
EXTernal trigger level, 441
external trigger overload, 225
external trigger probe attenuation factor, 222
external trigger probe ID, 223
external trigger probe sensing, 575
external trigger protection, 225
external trigger signal type, 224
EXTernal trigger source, 444
external trigger units, 227
F
FACTion commands, 541
FACTors commands, 541
fail (mask test) output, 336
failed waveforms in mask test, 328
failure, self test, 120

Agilent Technologies InfiniiVision 5000 Series Specifications

General

Brand	Agilent Technologies
Model	InfiniiVision 5000 Series
Category	Test Equipment
Language	English