4: Multi-frequency capacitance-voltage unit Model 4200A-SCS Parameter Analyzer
4-78 4200A-901-01 Rev. C / February 2017
bias-neg test
This test applies a negative DC bias voltage to the MOS capacitor. The voltage continues to be
applied to the sample as the DUT is heated in the next test module, hotchuck.
Formulator formulas and constants
Formulas are not used for this test.
bias-neg Analyze sheet
The test data is displayed in the Analyze sheet:
• Time: Timestamp for each measurement.
• Cp_GB: Measured parallel capacitance.
• Gp_GB: Measured conductance.
• DCV_GB: Forced DC bias voltage.
• F_GB: Forced test frequency.
• CVU1S: Status code for each measurement. Rows highlighted in blue indicate a fault. For details,
see Measurement status (on page 6-191
).
GB = gate-to-bulk.
hotchuck action
This action prompts you to turn on the hot chuck to a specified temperature and then to cool down the
sample. After the temperature stress, select OK to generate the C-V sweep in the following test. The
bias voltage is output until you select OK.
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