-SCS Parameter Analyzer Reference Manual Section 6:
4200A-901-01 Rev. C / February 2017 6-163
Set the stress/measure mode subsite Stress Properties
The subsite stress properties include stress voltages or currents and limits. You also set matrix
connection pin assignments for each device in the subsite.
This procedure assumes you have completed the steps in Choose the stress mode (on page 6-153
)
and Set up stress/measure mode timing (on page 6-159).
To copy settings between devices and sites, refer to Clear, copy, paste, and paste to all sites (on
page 6-169).
In the Stress Properties pane, the names for device terminals (such as drain, gate, source, and bulk)
and the enabled fields for those terminals are set automatically by Clarius. The terminal names
correspond to the terminal names used by the tests for the device. When you select a test in the
project tree for the device, it shows the schematic of the device and the names of the terminals.
For AC Voltage Stress, the bandwidth of the interconnect, including any switch matrix, will determine
the fastest rise/fall transition transmitted with minimal overshoot or undershoot. The impedance of
the device terminal affects both the stress and low level voltages. You can use an oscilloscope to
ensure that the rise/fall times and voltage levels match the requested test parameters.
To set up the subsite Stress Properties for stress/measure mode:
1. In the project tree, select the Subsite.
2. Select Configure. The Configure pane displays the Subsite Stress Properties, as shown in the
figure below.
3. If the subsite contains more than one device, select Prev Device or Next Device to display the
settings for the correct device. The selected device name is diplayed to the left of the buttons.
4. If a pulse card will be used for the stress, select the Stress Type: AC Voltage.
Current only: When setting the current stress level for each device in the subsite, keep in mind that a
setting of zero (0) connects the device pin to the ground unit (0 V ground). In order to current stress
a device, the current level must be set to a non-zero value.
5. Set the Stress Conditions (on page 6-164).
6. Set the Device Pin / Switch Connections (on page 6-165).
7. Set the Parameter Properties/Degradation Targets (on page 6-167).
8. Set the Stress Measurements (on page 6-169).
9. DC stressing only: Select Leave Stress Conditions On to keep the outputs of the SMUs on after
the end of a stress cycle. This allows the stress to continue until the next test is performed in the
project tree. You may want to keep stress on as long as possible so the DUT does not relax
before the tests are made. Note that if the system contains includes a matrix (Series 700 or
4200A-CVIV), the outputs are turned off at the end of a stress cycle regardless of this setting.
10. Select Save.
11. Select Check Resources to check the availability of SMU and VPU resources and check the
matrix connections for the selected site.
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