Configuring the Internal Baseband Source
R&S
®
SMW200A
302User Manual 1175.6632.02 ─ 16
mines the ARB clock frequency: "Clock Frequency" = "Frequency" * "Samples per
Period".
Note: Because the resulting clock rate must not exceed the maximum ARB clock
rate (see data sheet), the number of sample values is automatically restricted
depending on the selected frequency.
The first sine signal is mapped on the I samples, the second on the Q samples.
The two signals differ by a selectable phase offset. For a –90 deg offset, the result
is a unit vector in the I/Q plane, rotating counter-clockwise and starting at I = 0, Q =
–1. For a 0 deg offset, the I and Q samples are on the diagonal of a unit square (I(t)
= Q(t)).
In general the I/Q samples are located on a deformed circle which is confined to
the dashed square in the upper diagrams.
●
Rect Test Signal: Rectangle signal with selectable but equal On and Off periods
and amplitude. The period is defined by the selected frequency: <Period> = 1 /
"Frequency".
The signal is mapped on both the I and Q samples. This results in two distinct
points in the I/Q plane. The "Offset DC" shifts both points along the diagonal I(t) =
Q(t).
●
Const I/Q Test Signal: Continuous test signal with constant IQ and constant Clock
Frequency of 10 KHz. The values for each I and Q components are selectable but
constant. They are defined as a decimal number, which is decimal-to-binary con-
verted internally. The signal is provided as a 16-bit wide digital signal for both I and
Q channels.
Using the Arbitrary Waveform Generator (ARB)
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