09/03
6-117
DC 3535/2240/1632, WC M24
dC612
General Procedures and Information
Initial issue
13-0 Binary Highlight PG (Highlight gradation check) Gradation pattern for highlight adjustment
LUT: Ctrax off; IOT off
In the gradation reproducibility of Primary color/Secondary color/Ter-
tiary color, the highlight parts easily varied can be checked in detail.
For checking TRC.
IPS
13-1 Binary Highlight PG (Highlight gradation check) Gradation pattern for highlight adjustment
LUT: Ctrax off; IOT ON
In the gradation reproducibility of Primary color/Secondary color/Ter-
tiary color, the highlight parts easily varied can be checked in detail.
For checking TRC.
IPS
13-2 Binary Highlight PG (Highlight gradation check) Gradation pattern for highlight adjustment
LUT: Ctrax ON; IOT off
In the gradation reproducibility of Primary color/Secondary color/Ter-
tiary color, the highlight parts easily varied can be checked in detail.
For checking TRC.
IPS
13-3 Binary Highlight PG (Highlight gradation check) Gradation pattern for highlight adjustment
LUT: Ctrax ON; IOT ON
In the gradation reproducibility of Primary color/Secondary color/Ter-
tiary color, the highlight parts easily varied can be checked in details.
For checking TRC.
IPS
19 IIT FS Increment Grada-
tion
Fast Scan direction gradation YMC process BK pattern Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
20 IIT SS Increment Grada-
tion
Slow Scan direction gradation YMC process BK pattern
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
21 Shading Data Output Shading RAM data output pattern Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
22 COSAC Count Mode
YMCK Process Direc-
tion Stripe
10.84mm width YMCK process direction stripe pattern For separating troubles. It determines the defective locations when
an error image was output. Normal: Pre IPS Asic onwards can be
determined as normal.
IPS
23 COSAC Count Mode 8
level pattern
21.67x10.84mm 8 gradation patch pattern Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
24 COSAC Solid PG ALL
A4
Solid Data Pattern. Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
25 AES L* Pass Check 32.51mm grey + 10.84mm white, vertical stripe pattern. Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
26 VIPER Grid 4C 10.84mm grid pattern. 4 color mode Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
27 VIPER Grid BW 10.84mm grid pattern. black mode Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
28 FSRE Count Mode Grid 5.42mm YMCK Grid Pattern. It determines the defective locations when an error image was out-
put. Normal: Pre IPS Asic onwards can be determined as normal.
IPS
29 FSRE Count Mode/
Slanting Grid
5.42mm YMCK Slanting Grid Pattern. Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
30 VIPER Fixed Pattern
Output/BW Binary
Connection between IPS-Controller CHK Entire 2dot width Horizontal Lad-
der Pattern.
Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
31 VIPER Fixed Pattern
Output/4C Binary
Entire 2dot width Horizontal Ladder Pattern. Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
32 TAG fixed binary copy 1 TAG='0' fixed copy. Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
33 TAG fixed binary copy 2 TAG='1' fixed copy. Determine the defect locations when IPS defect and ASIC poor
installation etc. has occurred.
IPS
Table 1 Test Patterns
No. Description Overview Purpose Location
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