ST STM32L0x3 User Manual

True random number generator (RNG) RM0367
474/1043 RM0367 Rev 7
20.6 RNG entropy source validation
20.6.1 Introduction
In order to assess the amount of entropy available from the RNG, STMicroelectronics has
tested the peripheral using NIST SP800-22 rev1a statistical tests. The results can be
provided on demand or the customer can reproduce the tests.
For more information on running this NIST statistical test suite, refer to STM32
microcontrollers random number generation validation using NIST statistical test suite
application note (AN4230), available on STMicroelectronics website.
20.6.2 Validation conditions
STMicroelectronics has tested the RNG true random number generator in the following
conditions:
• RNG clock rng_clk= 48 MHz (CED bit = ’0’ in RNG_CR register) and rng_clk = 400 kHz
(CED bit = ‘1’ in RNG_CR register).
20.6.3 Data collection
In order to run statistical tests it is required to collect samples from the entropy source at raw
data level as well as at the output of the entropy source.Contact STMicroelectronics if above
samples need to be retrieved for your product.

ST STM32L0x3 Specifications

General

Brand	ST
Model	STM32L0x3
Category	Microcontrollers
Language	English