Agilent Technologies InfiniiVision 3000 X-Series Programmer's Guide

Index
Agilent InfiniiVision 3000 X-Series Oscilloscopes Programmer's Guide 1273
LIN triggering, 630
line frequency setting for current harmonics
analysis, 541
line glitch trigger source, 915
line number for TV trigger, 944
line terminator, 157
LINE trigger level, 903
LINE trigger source, 906
list of channel labels, 306
LISTer commands, 375
lister display, 377
lister time reference, 378
ln (natural logarithm) math function, 347
ln math function, 327
load utilization (CAN), 658
local lockout, 856
lock, 856
lock mask to signal, 507
lock, analog channel protection, 861
lockout message, 856
log (common logarithm) math function, 347
log math function, 327
logic level activity, 1049
long form, 1140
low frequency sine with glitch demo signal, 283
low pass filter math function, 327
low trigger level, 885
lower threshold, 433
lower threshold voltage for
measurement, 1066
lowercase characters in commands, 1139
low-frequency reject filter, 904
low-level voltage, waveform generator, 1031
low-pass filter cutoff frequency, 339
low-pass filter math function,
347
low-pass filter used to limit bandwidth, 264,
318
LRN (Learn Device Setup), 171
lsbfirst, 967
M
M1553 SEARch commands, 839
M1553 trigger commands, 731
M1553 trigger type, 737
magnify math function, 327, 347
magnitude of occurrence, 454
main sweep range, 873
main time base, 1093
main time base mode, 867
making measurements, 406
MAN option for probe sense, 1054, 1058
manual cursor mode, 381
MARKer commands, 379
marker mode, 389
marker position, 390
marker readout, 1072, 1073
marker set for voltage measurement, 1078,
1079
marker sets start time, 1069
marker time, 1068
markers for delta voltage measurement, 1077
markers track measurements, 443
markers, command overview, 380
markers, mode, 381
markers, time at start, 1073
markers, time at stop, 1072
markers, X delta, 386
markers, X1 position, 382
markers, X1Y1 source, 383
markers, X2 position, 384
markers, X2Y2 source, 385
markers, Y delta, 391
markers, Y1 position, 389
markers, Y2 position, 390
mask, 166, 180
mask command, bus, 249
mask statistics, reset, 501
mask test commands, 489
Mask Test Event Enable Register
(MTEenable), 201
mask test event event register, 203
Mask Test Event Event Register
(:MTERegister[:EVENt]), 203, 1122
mask test run mode, 508
mask test termination conditions, 508
mask test, all channels, 494
mask test, enable/disable, 506
mask, delete, 505
mask, get as binary block data, 504
mask, load from binary block data, 504
mask, lock to signal, 507
mask, recall, 601
mask, save, 615, 616
masks, bind levels, 516
master summary status bit, 183
math filters, 327
math function, stop displaying, 198
math operators, 326
math transforms, 326
math visualizations, 327
MAV (Message Available), 165, 181, 183
maximum duration, 910, 922, 923
maximum position, 868
maximum range for zoomed window, 874
maximum scale for zoomed window, 875
maximum vertical value measurement, 459
maximum vertical value, time of, 467, 1070
maximum waveform data length, 624
MEASure commands, 395
measure mask test failures, 509
measure overshoot, 430
measure period, 433
measure phase between channels, 434
MEASure power commands, 469
measure preshoot, 436
measure start voltage, 1078
measure stop voltage, 1079
measure value at a specified time, 464
measure value at top of waveform, 465
measurement error, 406
measurement record, 974
measurement setup, 406, 444
measurement source, 444
measurement statistics results, 438
measurement statistics, display on/off, 447
measurement trend math function, 327, 347
measurement window, 466
measurements, AC RMS, 423, 463
measurements, area, 409, 418
measurements, average value, 420, 457
measurements, base value, 421, 458
measurements, built-in, 61
measurements, burst width, 410
measurements, clear, 411, 1067
measurements, command overview, 406
measurements, counter, 412
measurements, DC RMS, 423, 463
measurements, definition setup, 414
measurements, delay, 416
measurements, duty cycle, 424
measurements, fall time, 425
measurements, falling edge count, 427
measurements, falling pulse count, 428
measurements, frequency, 426
measurements, how autoscale affects, 193
measurements, lower threshold level, 1066
measurements, maximum vertical value, 459
measurements, maximum vertical value, time
of, 467, 1070
measurements, minimum vertical value, 460
measurements, minimum vertical value, time
of, 468, 1071
measurements, overshoot, 430
measurements, period, 433
measurements, phase, 434
measurements, preshoot, 436
measurements, pulse width, negative, 429
measurements, pulse width, positive, 437
measurements, ratio of AC RMS values, 462
measurements, rise time, 441
measurements, rising edge count, 432
measurements, rising pulse count, 435
measurements, show, 443
measurements, snapshot all, 408
measurements, source channel, 444
measurements, standard deviation, 442
measurements, start marker time, 1072
measurements, stop marker time, 1073
measurements, thresholds, 1069
measurements, time between start and stop
markers, 1068
measurements, time between trigger and
edge, 452
measurements, time between trigger and
vertical value, 454
measurements, time between trigger and
voltage level, 1074
measurements, upper threshold value, 1076
measurements, vertical amplitude, 419, 456
measurements, vertical peak-to-peak, 422, 461
measurements, voltage difference, 1077
memory setup, 179, 862
menu, system, 857
message available bit, 183
message available bit clear, 165

Agilent Technologies InfiniiVision 3000 X-Series Specifications

General

Brand	Agilent Technologies
Model	InfiniiVision 3000 X-Series
Category	Test Equipment
Language	English