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NXP Semiconductors K22F series - Page 1390

NXP Semiconductors K22F series
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The value shown adjacent to each state transition in this figure represents the value of TMS at the time
of a rising edge of TCK.
TEST LOGIC
RESET
RUN-TEST/IDLE
SELECT-DR-SCAN
SELECT-IR-SCAN
CAPTURE-DR
CAPTURE-IR
SHIFT-IR
SHIFT-DR
EXIT1-DR
EXIT1-IR
PAUSE-DR
PAUSE-IR
EXIT2-IR
EXIT2-DR
UPDATE-DR
UPDATE-IR
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Figure 51-4. IEEE 1149.1-2001 TAP controller finite state machine
51.4.3.1
Enabling the TAP controller
The JTAGC TAP controller is enabled by setting the JTAGC enable to a logic 1 value.
Functional description
K22F Sub-Family Reference Manual, Rev. 4, 08/2016
1390 NXP Semiconductors

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