The 'factory' margin is a bigger deviation from the norm, a more stringent read criteria
that should only be attempted immediately (or very soon) after completion of an erase or
program command, early in the cycling life. 'Factory' margin levels can be used to check
that flash memory contents have adequate margin for long-term data retention at the
normal level setting. If unexpected results are encountered when checking flash memory
contents at 'factory' margin levels, the flash memory contents should be erased and
reprogrammed.
CAUTION
Factory margin levels must only be used during verify of the
initial factory programming.
29.4.11
Flash Command Description
This section describes all flash commands that can be launched by a command write
sequence.
The flash memory module sets the FSTAT[ACCERR] bit and aborts the command
execution if any of the following illegal conditions occur:
• There is an unrecognized command code in the FCCOB FCMD field.
• There is an error in a FCCOB field for the specific commands. Refer to the error
handling table provided for each command.
Ensure that FSTAT[ACCERR] and FSTAT[FPVIOL] are cleared prior to starting the
command write sequence. As described in Launch the Command by Clearing CCIF, a
new command cannot be launched while these error flags are set.
Do not attempt to read a flash block while the flash memory module is running a
command (FSTAT[CCIF] = 0) on that same block. The flash memory module may return
invalid data to the MCU with the collision error flag (FSTAT[RDCOLERR]) set.
CAUTION
Flash data must be in the erased state before being
programmed. Cumulative programming of bits (adding more
zeros) is not allowed.
Chapter 29 Flash Memory Module (FTFA)
K22F Sub-Family Reference Manual, Rev. 4, 08/2016
NXP Semiconductors 659
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