WDOG memory map
Absolute
address
(hex)
Register name
Width
(in bits)
Access Reset value
Section/
page
4005_2000
Watchdog Status and Control Register High
(WDOG_STCTRLH)
16 R/W 01D3h 24.7.1/529
4005_2002
Watchdog Status and Control Register Low
(WDOG_STCTRLL)
16 R/W 0001h 24.7.2/531
4005_2004 Watchdog Time-out Value Register High (WDOG_TOVALH) 16 R/W 004Ch 24.7.3/531
4005_2006 Watchdog Time-out Value Register Low (WDOG_TOVALL) 16 R/W 4B4Ch 24.7.4/532
4005_2008 Watchdog Window Register High (WDOG_WINH) 16 R/W 0000h 24.7.5/532
4005_200A Watchdog Window Register Low (WDOG_WINL) 16 R/W 0010h 24.7.6/533
4005_200C Watchdog Refresh register (WDOG_REFRESH) 16 R/W B480h 24.7.7/533
4005_200E Watchdog Unlock register (WDOG_UNLOCK) 16 R/W D928h 24.7.8/533
4005_2010 Watchdog Timer Output Register High (WDOG_TMROUTH) 16 R/W 0000h 24.7.9/534
4005_2012 Watchdog Timer Output Register Low (WDOG_TMROUTL) 16 R/W 0000h
24.7.10/
534
4005_2014 Watchdog Reset Count register (WDOG_RSTCNT) 16 R/W 0000h
24.7.11/
535
4005_2016 Watchdog Prescaler register (WDOG_PRESC) 16 R/W 0400h
24.7.12/
535
24.7.1 Watchdog Status and Control Register High
(WDOG_STCTRLH)
Address: 4005_2000h base + 0h offset = 4005_2000h
Bit 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
Read 0
DISTESTWDO
G
BYTESEL[1:0]
TESTSEL
TESTWDOG
0
Reserved
WAITEN
STOPEN
DBGEN
ALLOWUPDAT
E
WINEN
IRQRSTEN
CLKSRC
WDOGEN
Write
Reset
0 0 0 0 0 0 0 1 1 1 0 1 0 0 1 1
WDOG_STCTRLH field descriptions
Field Description
15
Reserved
This field is reserved.
This read-only field is reserved and always has the value 0.
14
DISTESTWDOG
Allows the WDOG’s functional test mode to be disabled permanently. After it is set, it can only be cleared
by a reset. It cannot be unlocked for editing after it is set.
0 WDOG functional test mode is not disabled.
1 WDOG functional test mode is disabled permanently until reset.
13–12
BYTESEL[1:0]
This 2-bit field selects the byte to be tested when the watchdog is in the byte test mode.
Table continues on the next page...
Chapter 24 Watchdog Timer (WDOG)
K22F Sub-Family Reference Manual, Rev. 4, 08/2016
NXP Semiconductors 529