NXP Semiconductors K22F series - Page 1401

A.26 OSC changes
• No substantial content changes
A.27 RTC Oscillator changes
• No substantial content changes
A.28 FMC changes
• The Flash Access Control function is part of the FMC and is now described within the FMC functional description.
• Updated FMC_PFAPR register.
• In "Flash Command Impact" and "FAC application tips" sections, removed SWAP information, because it is not
supported on this device.
A.29 FTFA changes
• Add ACCERR check for sector size larger than segment size in Error Handling table for RD1XA and ERSXA
commands
• Modify FSEC[MEEN] register field description
• Modify Flash Commands by Mode table entries for Read 1s All Blocks and Erase All Blocks commands
• Add Read 1s All Execute-only Segments and Erase All Execute-only Segments commands; modify list of Margin Read
Commands
• Add reference to AN5112 in Flash Access Protection
• Add ACCERR check for mode/security in Error Handling table for Verify Backdoor Access Key and Read 1s All Blocks
commands
• Change column heading from Byte to Offset Address in configuration field description table
• Add suggestion to bit poll FSTAT[CCIF] for command completion in Generic flash command write sequence flowchart
• Clarify that ACCERR and FPVIOL flags must be clear before ERSSUSP can be set in Suspending an Erase Flash
Sector Operation
• Remove erroneous reference to the flash configuration field in Suspending an Erase Flash Sector Operation
• Specify minimum time of 4.3 msec between request to resume and suspend erase in Resuming an Erase Flash Sector
Operation
• Correct FPROT register description when supporting 2KB sectors
• Add list of specific commands impacted by Flash Access Protection
• Clarify writability of ACCERR and FPVIOL while CCIF is set in FSTAT register description
• In FTFA_FACSN[NUMSG], changed bit field value from 0x40 to 0x4x
Appendix A Release Notes for Revision 4
K22F Sub-Family Reference Manual, Rev. 4, 08/2016
NXP Semiconductors 1401