NXP Semiconductors K22F series - Page 1400

• Editorial changes.
• Removed "(INTC)" from Interrupt Request Register (DMA_INT) description.
• Changed the following descriptive names of registers and fields:
• TCD Minor Byte Count (Minor Loop Disabled) to TCD Minor Byte Count (Minor Loop Mapping Disabled).
• TCD Signed Minor Loop Offset (Minor Loop Enabled and Offset Disabled) to TCD Signed Minor Loop Offset
(Minor Loop Mapping Enabled and Offset Disabled).
• TCD Signed Minor Loop Offset (Minor Loop and Offset Enabled) to TCD Signed Minor Loop Offset (Minor Loop
Mapping and Offset Enabled).
• Link Channel Number to Minor Loop Link Channel Number (DMA_TCDn_CITER_ELINKYES[LINKCH]).
• Link Channel Number to Major Loop Link Channel Number (DMA_TCDn_CSR[MAJORLINKCH]).
• Edited Introduction.
• Dynamic channel linking : Added cross-reference to TCD structure.
• Features : Replaced "optional" with other wording to improve clarity.
• Changed note in CLM field description of DMA_CR register.
• Error Status Register (DMA_ES) : Added two causes of channel errors to list in register description.
• DMA_TCDn_CSR[ACTIVE ]: Changed access from RW to RO.
• Error Status Register (DMA_ES) : Removed bullet about uncorrectable TCD SRAM errors.
• eDMA initialization : In bullet beginning with "Enable any hardware service requests..." replaced "ERQH and ERQL
registers" with "ERQ register."
• Error Status Register (DMA_ES) : In description, replaced "See the Error Reporting and Handling section" with "See
Fault reporting and handling.
A.23 EWM changes
• Substantial changes throughout the chapter which include:
• Changed the term "service" to "refresh" throughout the chapter to better explain the EWM refresh mechanism.
• Updated the block diagram.
• Updated the table "EWM refresh mechanism".
• Editorial changes
A.24 WDOG changes
• No substantial content changes
A.25 MCG changes
• Updated the bitfield access of ATMF and LOCS0 in the MCG_SC register
• Added footnote to MCG_C2[FCTRIM] field
• Updated the reset value of MCG_C2[FCTRIM] to x
EWM changes
K22F Sub-Family Reference Manual, Rev. 4, 08/2016
1400 NXP Semiconductors