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Tektronix TDS5000B Series Online Programmer Guide

Tektronix TDS5000B Series
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TDS5000B Online Programmer Guide
-- 5 9 1 --
This measurement only works for fast acquisition signals or a refer-
ence waveform saved in fast acquisition mode.
Extinction Ratio = (High / Low), ratios greater than 100 or less than 1
generate errors; low must be greater than or equal to 1 microwatt.
H EYEHeight
This measures the vertical opening of an eye diagram in volts.
H EYEWidth
This measures the width of an eye diagram in seconds.
H FALL
This measures the time taken for the falling edge of the first pulse in
the waveform or gated region to fall from a high reference value (de-
fault is 90%) to a low reference value (default is 10%).
H FREQuency
This measures the first cycle in the waveform or gated region. Fre-
quency is the reciprocal of the period and is measured in hertz (Hz),
where 1 Hz = 1 cycle per second.
H HIGH
This measures the High reference (100% level, sometimes called Top-
line) of a waveform.
You can also limit the High measurement (normally taken over the
entire waveform record) to a gated region on the waveform.
H HITs
The hits--in--box histogram measurement measures the number of
points in or on the histogram box.
H LOW
This measures the Low reference (0% level, sometimes called Base-
line) of a waveform.
H MAXimum
This finds the maximum amplitude. This value is the most positive
peak voltage found. It is measured over the entire waveform or gated
region.
When histogram is selected with the MEASUrement:METHod com-
mand, the maximum measurement measures the voltage of the highest
nonzero bin in vertical histograms or the time of the rightmost bin in
horizontal histograms.
H MEAN
This amplitude measurement finds the arithmetic mean over the entire
waveform or gated region.
When histogram is selected with the MEASUrement:METHod com-
mand, the mean measurement measures the average of all acquired
points within or on the histogram.

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Tektronix TDS5000B Series Specifications

General IconGeneral
BrandTektronix
ModelTDS5000B Series
CategoryTest Equipment
LanguageEnglish

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