987
Event detection function for general BIs (GENBI)
The general BI event detection (GENBI) function examines the signals generated on the binary
input circuits (BIs); the GENBI function verifies the signals generated in terms of time, state,
and quality. Accordingly, the GENBI function can elevate the value of the BI signals that are
generated using external devices; the GENBI function can provide the IED functions with a
variety of information. Figure 4.10-1 shows the block diagram of the GENBI function; it shows
signals from external devices received at the BI circuits. The operation of the GENBI function
is available for all BI circuits. For simplicity, hereafter, the setting and operation of the GENBI
function is discussed for binary input circuit #1 (BI1) at IO#1 slot in the IED.
Acquisition
Time at state
changed
Direction information
at state changed.
Suppression when
appearance of
repetitive signals
Output from BI1
State data
(current value)
Time data
(time stamp)
Quality information
(accumulated)
Respective
output signals
Respective
output signals
States on external devices
Figure 4.10-1 Block diagram of GENBI
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Note: The implementation of such features is dependent upon the selection of hardware and
the configuration of functions. Several IED models do not support certain features. To
determine whether a particular feature has been implemented within an IED, identify the IED
ordering number; and check the order number at the “G&T position” whilst referring to the
comparison table below. For more information, see
Appendix: Ordering
.
Table 4.10-1 Comparative table in respective ordering numbers
✓: Applicable NA: Not applicable
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