EasyManua.ls Logo

Toshiba GR200 Series - (iv) Under-voltage element for phase-to-phase (UVS-DIFL); (v) Under-voltage change detection element (UVD-DIFL); (vi) Check relays activation; 2.2.3 CT circuit-failure detection (DIFL-CTF)

Toshiba GR200 Series
1770 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Loading...
6F2S1914 (0.49)
GRL200 (Soft 033 & 037)
- 34 -
(iv) Under-voltage element for phase-to-phase (UVS-DIFL)
For UVS-DIFL relay element the user can set the sensitivity using setting [UVS-DIFL]. The
setting value is selected from 5.0 to 130.0V.
(v) Under-voltage change detection element (UVD-DIFL)
Suppose there is a difference between the voltage vector at present (V
M
) and the pre-voltage
vector measured one sampling cycle ago (V
N
). When the magnitude of the difference between
is larger than setting [DUV-DIFL], the UVD-DIFL element is operated. The setting value is
chosen among 1 to 20V.
Note: UVD-DIFL element (shown in Figure 2.2-4) is programmed with setting [DUV-
DIFL] as described above. Similarly, signals for monitoring and PLC output signals
are referred UVD-DIFL-AT etc., as shown in Figure 2.2-4 and Figure 2.2-6.
(vi) Check relays activation
The user can set On for respective scheme switches [DIFLFS-OCD-EN], [DIFLFS-OC-EN],
[DIFL-UV-EN], [DIFL-UVS-EN], and [DIFL-DUV-EN] so that the user can select the operation of
the respective check relays.
2.2.3 CT circuit-failure detection (DIFL-CTF)
The CT circuit-failure-detection function (DIFL-CTF) is to detection of the breaking wire in
the CT circuit. Signals of the check relays are injected into the below logic so that a trip signal
is not issued upon occurrence of CT failure.
DIFL-
CTF
A
B
C
8000021C20
8100021C21
8200021C22
DIFL-CTF_BLOCK
810002BB1
1
S 1
R
OPT-ON
8100021BB0
1
1
10.00s
t 0
&
1
UVD-DIFL-AT ()
UVD-DIFL-BT ()
UVD-DIFL-CT ()
From check relays
1
UV-DIFL-CT
UVS-DIFL-CT
From CT failure detection
DIFL-CTF-A_DET_T
DIFL-CTF-B_DET_T
DIFL-CTF-C_DET_T
&
&
&
1
1
1
&
&
&
CTFL-EN
ON
1
&
1
1
AMF-ON
From AMF
1
1
1
&
&
&
1
0.1s
t 0
1
S 1
R
1
1
1
1
0.1s
t 0
1
S 1
R
1
0.1s
t 0
1
S 1
R
1
1
1
EXTERNAL_DIFL-CTF
840002EBB0
8400021ABB1
8000021B65
DIFL-CTF_DETECT-A
8100021B66
DIFL-CTF_DETECT-B
8200021B67
DIFL-CTF_DETECT-C
1
To DIFL main logic
DIFL-CTF_ALARM
8300021B23
To DIFG
DIFL-CTF-A_DET_T
DIFL-CTF-B_DET_T
DIFL-CTF-C_DET_T
To CT failure detection
DIFL_BLOCK
8F0000EBB4
8F00001BB2
1
10.00s
t 0
8000021B64
DIFL-CTF_DET
Figure 2.2-6 CT failure detection logic
The user can select the detection type for the CT circuit-failure using setting [DIFL-CTF].

Table of Contents

Related product manuals