NXP Semiconductors MPC5566 - Page 1088

IEEE 1149.1 Test Access Port Controller (JTAGC)
MPC5566 Microcontroller Reference Manual, Rev. 2
Freescale Semiconductor 24-7
Figure 24-5. IEEE 1149.1-2001 TAP Controller Finite State Machine
Test logic
reset
Run-test/idle
Select-DR-scan
Select-IR-scan
Capture-DR
Capture-IR
Shift-DR
Shift-IR
Exit1-DR
Exit1-IR
Pause-DR
Pause-IR
Exit2-DR
Exit2-IR
Update-DR
Update-IR
1
0
1
1
1
00
0
0
1
1
0
0
1
1
1
1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
0
NOTE: The value shown adjacent to each state transition in this figure represents the value of TMS at the time
of a rising edge of TCK.