NXP Semiconductors MPC5566 - Cal_Ts; Evti; Evto; Gpio

Signal Description
MPC5566 Microcontroller Reference Manual, Rev. 2
2-8 Freescale Semiconductor
CAL_TS Calibration transfer start P O V
DDE12
F – / Up – / Up — AA11
NEXUS
EVTI Nexus event in P I V
DDE7
F I / Up EVTI / Up F25 G26
EVTO
Nexus event out P O V
DDE7
F O / Low
EVTO
/ High
F26 G27
MCKO Nexus message clock out P O V
DDE7
F O / Low
MCKO /
Enabled
14
G24 H26
MDO[0]
15
Nexus message data out P O V
DDE7
F O / High MDO / Low B24 C25
MDO[3:1] Nexus message data out P O V
DDE7
F O / Low MDO / Low
C23, D21,
C22
C24, B21,
C23
MDO[11:4]_
16
GPIO[82:75]
Nexus message data out
GPIO
P
G
O
I/O
V
DDE7
F O / Low – / Down
B23, D20,
C21, B22,
A23, C20,
B21, A22
B24, C20,
B20, B23,
A24, A20,
C22, A23
MSEO
[1:0] Nexus message start/end out P O V
DDE7
F O / High
MSEO
/ High
F23, G23 G24, H24
RDY
Nexus ready output P O V
DDE7
F O / High
RDY
/ High
H23 J24
JTAG / TEST
TCK JTAG test clock input P I V
DDE7
F
TCK
/ Down
TCK
/ Down
D25 E27
TDI JTAG test data input P I V
DDE7
F TDI / Up TDI / Up D26 E28
TDO JTAG test data output P O V
DDE7
FTDO / Up
17
TDO / Up E25 F27
TMS JTAG test mode select input P I V
DDE7
F TMS / Up TMS / Up E24 E26
JCOMP JTAG TAP controller enable P I V
DDE7
F
JCOMP
/ Down
JCOMP
/ Down
F24 F26
TEST
Test mode select P I V
DDE7
F
TEST
/ Up
TEST
/ Up
E26 F28
FlexCAN
CNTXA_
TXDA_
GPIO[83]
FlexCAN A transmit
eSCI A transmit
GPIO
P
A
G
O
O
I/O
V
DDEH4
SH I / Up – / Up
18
AD21 AF22
CNRXA_
RXDA_
GPIO[84]
FlexCAN A receive
eSCI A receive
GPIO
P
A
G
I
I
I/O
V
DDEH4
SH – / Up – / Up
18
AE22 AG22
CNTXB_
PCSC[3]_
GPIO[85]
FlexCAN B transmit
DSPI C peripheral chip select
GPIO
P
A
G
O
O
I/O
V
DDEH4
MH – / Up – / Up AF22 AG23
CNRXB_
PCSC[4]_
GPIO[86]
FlexCAN B receive
DSPI C peripheral chip select
GPIO
P
A
G
I
O
I/O
V
DDEH4
MH – / Up – / Up AF23 AH23
Table 2-1. MPC5566 Signal Properties (continued)
Signal Names Signal Functions
1
P/
A/
G
I/O
Type Voltage
2
Pad
Type
3
Status
416
Package
496
Vertical
Assembly
4
During
Reset
5
After
Reset
6