NXP Semiconductors MPC5566 - Page 844

Enhanced Queued Analog-to-Digital Converter (eQADC)
MPC5566 Microcontroller Reference Manual, Rev. 2
Freescale Semiconductor 19-41
NOTE
Simultaneous write accesses from ADC0 and ADC1 to ADC_TBCR are not
allowed.
19.3.3.4 ADCn Gain Calibration Constant Registers (ADC0_GCCR and
ADC1_GCCR)
The ADCn_GCCR contains the gain calibration constant used to fine-tune the ADCn conversion results.
Refer to Section 19.4.5.4, “ADC Calibration Feature,” for details about the calibration scheme used in the
eQADC.
Address: 0x0003 Access: R/W
0123456789101112131415
R
TBC_VALUE
W
Reset0000000000000000
Figure 19-21. ADC Time Base Counter Register (ADC_TBCR)
Table 19-31. ADC_TBCR Field Descriptions
Field Description
0–15
TBC_
VALUE
[0:15]
Time base counter VALUE. Contains the current value of the time base counter. Reading TBC_VALUE returns the
current value of time base counter. Writes to TBC_VALUE register load the written data to the counter. The time base
counter counts from 0x0000 to 0xFFFF and wraps when reaching 0xFFFF.
Address: 0x0004 Access: R/W
0123456789101112131415
R0
GCC0
W
Reset0100000000000000
16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
R0
GCC1
W
Reset0100000000000000
Figure 19-22. ADCn Gain Calibration Constant Registers (ADCn_GCCR)