EasyManuals Logo

Texas Instruments TMS570LC4357 User Manual

Texas Instruments TMS570LC4357
2208 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Page #405 background imageLoading...
Page #405 background image
405
SPNU563AMarch 2018
Submit Documentation Feedback
Copyright © 2018, Texas Instruments Incorporated
Programmable Built-In Self-Test (PBIST) Module
Chapter 9
SPNU563AMarch 2018
Programmable Built-In Self-Test (PBIST) Module
This chapter describes the programmable built-in self-test (PBIST) controller module used for testing the
on-chip memories.
Topic ........................................................................................................................... Page
9.1 Overview ......................................................................................................... 406
9.2 RAM Grouping and Algorithm ............................................................................ 407
9.3 PBIST Flow...................................................................................................... 408
9.4 Memory Test Algorithms on the On-chip ROM .................................................... 411
9.5 PBIST Control Registers ................................................................................... 412
9.6 PBIST Configuration Example............................................................................ 426

Table of Contents

Questions and Answers:

Question and Answer IconNeed help?

Do you have a question about the Texas Instruments TMS570LC4357 and is the answer not in the manual?

Texas Instruments TMS570LC4357 Specifications

General IconGeneral
BrandTexas Instruments
ModelTMS570LC4357
CategoryMicrocontrollers
LanguageEnglish

Related product manuals