Texas Instruments TMS570LC4357 User Manual

www.ti.com Control and Status Registers
395
SPNU563A–March 2018
Submit Documentation Feedback
Copyright © 2018, Texas Instruments Incorporated
Level 2 RAM (L2RAMW) Module
8.3.2 L2RAMW Error Status Register (RAMERRSTATUS)
The RAMERRSTATUS register, shown in Figure 8-3 and described in Table 8-4, indicates the status of
the various error conditions monitored by the L2RAMW Module.
Figure 8-3. L2RAMW Module Error Status Register (RAMERRSTATUS) (offset = 10h)
31 24
Reserved
R-0
23 22 21 20 19 18 17 16
Reserved DRDE DRSE DWDE DWSE MSSM MSRA MSACP
R-0 R/W1CP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0
15 14 13 12 11 10 9 8
CPEOI Reserved MIE MMDE WEMDE REMDE MME PACE
R/W1CP-0 R-0 R/W1CP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0
7 6 5 4 3 2 1 0
RMWDE Reserved CPUWDE ADDE WEME ADE REME CPUWE
R/W1CP-0 R-0 R/W1CP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0
LEGEND: R/W = Read/Write; R = Read only; W1CP = Privilege Write 1 to Clear; -n = value after reset
Table 8-4. L2RAMW Module Error Status Register (RAMERRSTATUS) Field Descriptions
Bit Field Value Description
31-23 Reserved 0 Reads return 0. Writes have no effect.
22 DRDE Diagnostic Read Double-bit Error. This bit indicates that a double-bit error has occurred during
diagnostic of the L2RAMW SECDED logic that is used to handle read of read-modify write operations.
This bit must be cleared by writing a 1 to it before any new error can be generated.
0 A double-bit error did not occur during diagnostic.
1 A double-bit error occurred during diagnostic.
21 DRSE Diagnostic Read Single-bit Error. This bit indicates that a single-bit error has occurred during diagnostic
of the L2RAMW SECDED logic that is used to handle read of read-modify write operations. This bit
must be cleared by writing a 1 to it before any new error can be generated.
0 A single-bit error did not occur during diagnostic.
1 A single-bit error occurred during diagnostic.
20 DWDE Diagnostic Write Double-bit Error. This bit indicates that a double-bit error has occurred during
diagnostic of the L2RAMW SECDED logic that handles write operations. This bit must be cleared by
writing a 1 to it before any new error can be generated.
0 A double-bit error did not occur during diagnostic.
1 A double-bit error occurred during diagnostic.
19 DWSE Diagnostic Write Single-bit Error. This bit indicates that a single-bit error has occurred during diagnostic
of the L2RAMW SECDED logic that handles write operations. This bit must be cleared by writing a 1 to
it before any new error can be generated.
0 A single-bit error did not occur during diagnostic.
1 A single-bit error occurred during diagnostic.
18 MSSM Memory Scrubbing write back SECDED Malfunction. This indicates that a SECDED malfunction
occurred during memory scrubbing write back. This bit must be cleared by writing a 1 to it before any
new error can be generated.
0 A SECDED malfunction did not occur during scrubbing write back.
1 A SECDED malfunction occurred during scrubbing write back.
17 MSRA Memory Scrubbing write back Redundant Address decode error. This bit indicates that a redundant
address decode error occurred during memory scrubbing write back. This bit must be cleared by writing
a 1 to it before any new error can be generated.
0 An address decode error did not occur during scrubbing write back.
1 An address decode error occurred during scrubbing write back.

Texas Instruments TMS570LC4357 Specifications

General

Brand	Texas Instruments
Model	TMS570LC4357
Category	Microcontrollers
Language	English