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Texas Instruments TMS570LC4357 User Manual

Texas Instruments TMS570LC4357
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Is system in
Yes
Setup memories, peripheral and clock tree like
clock by writing PACT = 0x03
Select the RAM group and
algorithm using RINFO and
ALGO registers
Program OVER = 0 for self test without Override
Write ROM = 0x03 to enable the
microcode load of the algorithm
and RAM info groups from the
on Chip ROM
Write 0x14 to DLR register to
configure PBIST in ROM mode
Is (MSTDONE = 1) ?
Is FSRF0 = 1 ?
PBIST Selftest Done
Enable pbist clocks and ROM
Read RAMT reg for
Read FSRD and FSRA datalog
reg. for Fail data and address values
No
Yes
No
Yes
Wait for approximately
N
vbus clocks.
Reset the PBIST controller by
writing MSTGCR = 0x0A
Disable PBIST Test
Resume PBIST self test by writing
0x02 to the STR register
by writing MSTGCR = 0x05
Disable pbist clocks and ROM
reset = 1?
clock by writing PACT = 0
or OVER = 1 for RINFO Override
No
RGS/RDS info
HCLK, VCLK peripheral and ROMCLK as required
for the PBIST test.
and start the Test
Enable PBIST controller by
by writing MSIENA = 0x01
PBIST Flow
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SPNU563AMarch 2018
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Copyright © 2018, Texas Instruments Incorporated
Programmable Built-In Self-Test (PBIST) Module
9.3 PBIST Flow
Figure 9-2 illustrates the memory self-test flow.
Figure 9-2. PBIST Memory Self-Test Flow Diagram

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Texas Instruments TMS570LC4357 Specifications

General IconGeneral
BrandTexas Instruments
ModelTMS570LC4357
CategoryMicrocontrollers
LanguageEnglish

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