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Texas Instruments TMS570LC4357 User Manual

Texas Instruments TMS570LC4357
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Control and Status Registers
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398
SPNU563AMarch 2018
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Copyright © 2018, Texas Instruments Incorporated
Level 2 RAM (L2RAMW) Module
8.3.3 L2RAMW Diagnostic Data Vector High Register (DIAG_DATA_VECTOR_H)
The DIAG_DATA_VECTOR_H register, shown in Figure 8-4 and described in Table 8-5, is used in
conjunction with the RAMTEST register to perform diagnostic tests.
Figure 8-4. L2RAMW Diagnostic Data Vector High Register (DIAG_DATA_VECTOR_H)
(offset = 24h)
31 0
DIAGNOSTIC_VECTOR[63:32]
R/WP-0
LEGEND: R/W = Read/Write; WP = Write in privilege mode only; -n = value after reset
Table 8-5. L2RAMW Diagnostic Data Vector High Register (DIAG_DATA_VECTOR_H)
Field Descriptions
Bit Field Description
31-0 DIAGNOSTIC_VECTOR Used in conjunction with DIAG_DATA_VECTOR_L to form a 64-bit test vector used for
diagnostic test of two SECDEDs (read and write) and compare logic of the two SECDED
malfunctions and merged mux. This register is the upper 32 bits. This register is used in
conjunction with the RAMTEST register to perform diagnostic tests. See Section 8.2.6 for
details on how to start a diagnostic test.
8.3.4 L2RAMW Diagnostic Data Vector Low Register (DIAG_DATA_VECTOR_L)
The DIAG_DATA_VECTOR_L, shown in Figure 8-5 and described in Table 8-6, is used in conjunction
with the RAMTEST register to perform diagnostic tests.
Figure 8-5. L2RAMW Diagnostic Vector Low Register (DIAG_DATA_VECTOR_L)
(offset = 28h)
31 0
DIAGNOSTIC_VECTOR[31:0]
R/WP-0
LEGEND: R/W = Read/Write; WP = Write in privilege mode only; -n = value after reset
Table 8-6. L2RAMW Diagnostic Vector Low Register (DIAG_DATA_VECTOR_L)
Field Descriptions
Bit Field Description
31-0 DIAGNOSTIC_VECTOR Used in conjunction with DIAG_DATA_VECTOR_H to form a 64-bit test vector used for
diagnostic test of two SECDEDs (read and write) and compare logic of the two SECDED
malfunctions and merged mux. This register is the lower 32 bits. This register is used in
conjunction with the RAMTEST register to perform diagnostic tests. See Section 8.2.6 for
details on how to start a diagnostic test.

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Texas Instruments TMS570LC4357 Specifications

General IconGeneral
BrandTexas Instruments
ModelTMS570LC4357
CategoryMicrocontrollers
LanguageEnglish

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