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Texas Instruments TMS570LC4357 User Manual

Texas Instruments TMS570LC4357
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Control and Status Registers
397
SPNU563AMarch 2018
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Copyright © 2018, Texas Instruments Incorporated
Level 2 RAM (L2RAMW) Module
Table 8-4. L2RAMW Module Error Status Register (RAMERRSTATUS) Field Descriptions (continued)
Bit Field Value Description
4 ADDE Redundant address decoding diagnostic error. This bit indicates that the redundant address decode
logic diagnostic test has detected that a compare element has malfunctioned during the testing of the
logic. This bit is only set in test mode. This bit must be cleared by writing a 1 to it for generation of any
new uncorrectable error interrupt in non-test mode.
0 An error did not occur.
1 An error occurred.
3 WEME Write ECC Malfunction Error. This bit Indicates that the SECDED logic failed to correct a single bit error
during a CPU write operation. This bit must be cleared by writing a 1 to it before any new error can be
generated.
0 An error did not occur.
1 An error occurred.
2 ADE Address Decode Error. This bit indicates than an address error was generated by the redundant
address decode logic due to a functional failure. This bit must be cleared by writing a 1 to it before any
new error can be generated.
0 An error did not occur.
1 An error occurred.
1 REME Read ECC Malfunction Error. Indicates that the SECDED logic failed to correct a single bit error on the
read of a read-modify-write operation. This bit must be cleared by writing a 1 to it before any new error
can be generated.
0 An error did not occur.
1 An error occurred.
0 CPUWE CPU Write Single Error. This bit indicates that a single-bit error occurred during write access. This bit
must be cleared by writing 1 to it in order to clear the interrupt request and to enable subsequent single-
bit error interrupt generation.
0 An error did not occur.
1 An error occurred.

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Texas Instruments TMS570LC4357 Specifications

General IconGeneral
BrandTexas Instruments
ModelTMS570LC4357
CategoryMicrocontrollers
LanguageEnglish

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