STC Control Registers
www.ti.com
452
SPNU563A–March 2018
Submit Documentation Feedback
Copyright © 2018, Texas Instruments Incorporated
Self-Test Controller (STC) Module
10.8.7 Self-Test Fail Status Register (STCFSTAT)
This register is described in Figure 10-14 and Table 10-15.
NOTE: The three status bits can be cleared to their default values on a write of 1 to the bits.
Additionally when the STC_ENA key in STCGCR1 is written from a disabled state to an
enabled state, the three status bits get cleared to their default values. This register gets reset
to its default value with power-on reset assertion.
When multiple segments are enabled in a self-test run, the STC will indicate the self-test
complete on the first failed interval corresponding to a segment. The subsequent segments
will not be run. FSEG_ID bits in this register indicate which segment failed.
Figure 10-14. Self-Test Fail Status Register (STCFSTAT) [offset = 18h]
31 16
Reserved
R-0
15 5 4 3 2 1 0
Reserved FSEG_ID TO_ERR CORE2_FAIL CORE1_FAIL
R-0 RCP-0 R/W1CP-0 R/W1CP-0 R/W1CP-0
LEGEND: R/W = Read/Write; R = Read only; W1CP = Write 1 to clear in privilege mode; -n = value after reset
Table 10-15. Self-Test Fail Status Register (STCFSTAT) Field Descriptions
Bit Field Value Description
31-5 Reserved 0 Reads return 0. Writes have no effect.
4-3 FSEG_ID Failed Segment Number
0 Segment 0 Failed
1 Segment 1 Failed
All other values Reserved
2 TO_ERR Timeout Error
0 No time out error occurred.
1 Self-test run failed due to a timeout error.
1 CORE2_FAIL CORE2 failure info for segment 0 only.
0 No MISR mismatch for CORE2.
1 Self-test run failed due to MISR mismatch for CORE2.
0 CORE1_FAIL CORE1 failure info for segment 0 only.
0 No MISR mismatch for CORE1.
1 Self-test run failed due to MISR mismatch for CORE1.