Texas Instruments TMS570LC4357 User Manual

FlexRay Module Registers www.ti.com
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SPNU563A–March 2018
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26.3.2.7 Identification Registers
26.3.2.7.1 Core Release Register (CREL)
Figure 26-178 and Table 26-149 illustrate this register.
Figure 26-178. Core Release Register (CREL) [offset_CC = 3F0h]
31 28 27 20 19 16
REL STEP YEAR
R-release info R-release info R-release info
15 8 7 0
MON DAY
R-release info R-release info
LEGEND: R = Read only; -n = value after reset
Table 26-149. Core Release Register (CREL) Field Descriptions
Bit Field Value Description
31-28 REL 0-Fh Core Release. One digit, BCD-coded.
27-20 STEP 0-FFh Step of Core Release. Two digits, BCD-coded.
19-16 YEAR 0-Fh Design Time Stamp, Year. One digit, BCD-coded.
15-8 MON 0-FFh Design Time Stamp, Month. Two digits, BCD-coded.
7-0 DAY 0-FFh Design Time Stamp, Day. Two digits, BCD-coded.
Table 26-150 shows the release coding in register CREL.
Table 26-150. Release Coding
Release Step Sub-Step
Core Release Register
Contents
Name
1 0 0 1006 0519 Revision 1.0.0
1 0 1 1016 1211 Revision 1.0.1
1 0 2 10271031 Revision 1.0.2
1 0 3 10390206 Revision 1.0.3
26.3.2.7.2 Endian Register (ENDN)
Figure 26-179 and Table 26-151 illustrate this register.
Figure 26-179. Endian Register (ENDN) [offset_CC = 3F4h]
31 16
ETV
R-8765h
15 0
ETV
R-4321h
LEGEND: R = Read only; -n = value after reset
Table 26-151. Endian Register (ENDN) Field Descriptions
Bit Field Description
31-0 ETV Endianness Test Value. The Endianness test value is 87654321h.

Texas Instruments TMS570LC4357 Specifications

General

Brand	Texas Instruments
Model	TMS570LC4357
Category	Microcontrollers
Language	English