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Texas Instruments TMS570LC4357 User Manual

Texas Instruments TMS570LC4357
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FlexRay Module Registers
1331
SPNU563AMarch 2018
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Copyright © 2018, Texas Instruments Incorporated
FlexRay Module
26.3.2.1.3 ECC Test Register (ECCTEST)
The ECC Test Register can be used in diagnostic mode to read or write ECC information of message
RAM, transient buffer RAM, input buffer RAM and output buffer RAM locations. Write access to this
register is only possible when in diagnostic mode.
In order to be able to directly access the above mentioned RAM portions, RAM test mode must be
selected in test register 1 and the corresponding RAM section must be selected in test register 2. When
reading a certain RAM location, the corresponding ECC value is shown in RDECC bitfield. Writing to a
certain ECC location copies the contents of WRECC bitfield to the corresponding ECC location.
Figure 26-111 and Table 26-91 illustrate this register.
NOTE: For FTU RAM, a separate portion of memory-mapped RAM is available in TCR ECC test
mode, which can be accessed directly for reading or writing ECC information. See
Section 26.3.1.26 for more details.
Figure 26-111. ECC Test Register (ECCTEST) [offset_CC = 08h]
31 23 22 16
Reserved RDECC
R-0 R/W-0
15 7 6 0
Reserved WRECC
R-0 R/W-0
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 26-91. ECC Test Register (ECCTEST) Field Descriptions
Bit Field Value Description
31-23 Reserved 0 Reads return 0. Writes have no effect.
22-16 RDECC 0-7Fh Holds ECC bits when reading a RAM location.
15-7 Reserved 0 Reads return 0. Writes have no effect.
6-0 WRECC 0-7Fh ECC bits to be written in ECC location when writing to a RAM location.

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Texas Instruments TMS570LC4357 Specifications

General IconGeneral
BrandTexas Instruments
ModelTMS570LC4357
CategoryMicrocontrollers
LanguageEnglish

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