3 Spectrum Analyzer Mode
3.9 SEM Measurement
3.9 SEM Measurement
The Spectrum Emission Mask measurement analyzes spurious signal levels in up to
six pairs of offset frequencies and relates them to the carrier power.
SEM Measurement Commands
The following commands and queries can be used to configure the measurement,
then retrieve measurement results:
The general functionality of "CONFigure" on page 2753, "INITiate" on page 2754,
"FETCh" on page 2754, "MEASure" on page 2756, and "READ" on page 2755 are
described in the section SCPI Operation and Results Query in the topic
Programming the Instrument.
Note that, in general, :CONF:<measurement> resets the specified measurement
settings to their defaults. X-Series permits the addition of the NDEFault node to the
command, which prevents a measurement preset after a measurement switch.
:CONFigure:SEMask
:CONFigure:SEMask:NDEFault
:INITiate:SEMask
:FETCh:SEMask[n]?
:MEASure:SEMask[n]?
:READ:SEMask[n]?
Remote Command Results Overview
The following table provides an overview of the results returned by the :FETCh,
:MEASure, and :READ queries listed above, according to the index value n. For
Mode-specific details, click on the appropriate link for each n value.
Offsets that are turned off (inactive) return -999.0 or NAN when their results are
queried via SCPI. The value of NAN is 9.91E+37.
n Results
1 Result summary (Offsets A - F)
Note that n = 1 returns results of 6 offsets (Offset A to F)
See "Results for n = 1" on page 1529
2 Displayed frequency domain spectrum trace data for Trace 1
See "Results for n = 2-4" on page 1530
3 Displayed frequency domain absolute limit trace data
See "Results for n = 2-4" on page 1530
4 Displayed frequency domain relative limit trace data
Spectrum Analyzer Mode User's &Programmer's Reference 1527
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