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Keysight Technologies InfiniiVision 4000 X Series User Manual

Keysight Technologies InfiniiVision 4000 X Series
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614 Keysight InfiniiVision 4000 X-Series Oscilloscopes Programmer's Guide
24 :MEASure Commands
:MEASure:SLEWrate
(see page 1610)
Command Syntax
:MEASure:SLEWrate [<source>[,<slope>]]
<source> ::= {CHANnel<n> | FUNCtion<m> | MATH<m> | WMEMory<r>}
<n> ::= 1 to (# of analog channels) in NR1 format
<m> ::= 1 to (# math functions) in NR1 format
<r> ::= 1 to (# ref waveforms) in NR1 format
<slope> ::= {RISing | FALLing | EITHer}
The :MEASure:SLEWrate command installes a slew rate measurement on the
oscilloscope's front-panel screen.
The slew rate of an edge is the change in vertical value between the lower and
upper thresholds of a waveform source (typically volts) divided by the change in
time between where the waveform threshold crossings take place.
The lower and upper thresholds for the measurement are specified by the
measurement threshold settings for the source waveform (see :MEASure:DEFine).
If the <source> parameter is not specified, the current :MEASure:SOURce setting is
used
The on-screen edge closest to the timebase reference is measured.
You can specify that a RISing edge be measured, a FALLing edge be measured, or
either a rising or a falling edge be measured (EITHer). If the <slope> is not
specified, a rising edge is measured.
Query Syntax
:MEASure:SLEWrate? [<source>[,<slope>]]
The :MEASure:SLEWrate? query returns the measured slew rate of the specified
edge closest to the timebase reference.
Return Format
<value><NL>
<value> ::= slew rate in vertical units/second in NR3 format
See Also • ":MEASure:DEFine" on page 577
• ":MEASure:SOURce" on page 615
• ":MEASure:RISetime" on page 611
• ":MEASure:FALLtime" on page 590
• "Introduction to :MEASure Commands" on page 568
NOTE
This command is not available if the source is a FFT (Fast Fourier Transform) waveform.

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Keysight Technologies InfiniiVision 4000 X Series Specifications

General IconGeneral
BrandKeysight Technologies
ModelInfiniiVision 4000 X Series
CategoryTest Equipment
LanguageEnglish

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