NXP Semiconductors MPC5606S - External Signal Description

Reset Generation Module (MC_RGM)
MPC5606S Microcontroller Reference Manual, Rev. 7
1074 Freescale Semiconductor
Alternatively, it is possible for software to configure some reset source events to be converted from a reset
to either a Safe mode request issued to the MC_ME or to an interrupt issued to the core (see
Section 31.3.1.4, Destructive Event Reset Disable Register (RGM_DERD), and Section 31.3.1.6,
Destructive Event Alternate Request Register (RGM_DEAR), for ‘destructive’ resets and
Section 31.3.1.3, Functional Event Reset Disable Register (RGM_FERD), and Section 31.3.1.5,
Functional Event Alternate Request Register (RGM_FEAR), for ‘functional’ resets).
31.2 External signal description
The MC_RGM interfaces to the bidirectional reset pin RESET and the boot mode pins PAD[22:21].
31.3 Memory map and register definition
NOTE
Any access to unused registers as well as write accesses to read-only
registers will:
• Not change register content
• Cause a transfer error
Table 31-1. MC_RGM Register description
Address Name Description Size Access
0xC3FE_4000 RGM_FES Functional Event Status half-word read/write
1
0xC3FE_4002 RGM_DES Destructive Event Status half-word read/write
1
1
individual bits cleared on writing 1
0xC3FE_4004 RGM_FERD Functional Event Reset Disable half-word read/write
2
2
write once: 0 = disable, 1 = enable.
0xC3FE_4006 RGM_DERD Destructive Event Reset Disable half-word read
0xC3FE_4010 RGM_FEAR Functional Event Alternate Request half-word read/write
0xC3FE_4012 RGM_DEAR Destructive Event Alternate Request half-word read
0xC3FE_4018 RGM_FESS Functional Event Short Sequence half-word read/write
0xC3FE_401A RGM_STDBY Standby Reset Sequence half-word read/write
0xC3FE_401C RGM_FBRE Functional Bidirectional Reset Enable half-word read/write