NXP Semiconductors MPC5606S - Details of the SSD Measurement

Stepper Stall Detect (SSD)
MPC5606S Microcontroller Reference Manual, Rev. 7
Freescale Semiconductor 1175
Figure 36-11. Generic SSD Flow
36.4.2.2 Details of the SSD Measurement
This section describes in detail the steps introduced in Figure 36-11. Note that it describes only the
measurement process. The decision whether the stall position has been reached or another SM step is
required must be made by the controlling CPU depending from the measurement result. All control bits
are assumed to have their (inactive) reset values prior to entering the SSD measurement flow. The
following paragraphs relate to one complete BIS including the (optional) blanking phase followed by the
integration phase:
1. Start of Measurement
Start of Measurement
1
Initialize SSD
2
Start Blanking
3
Start Integration
5
End of Measurement
9
End of
Blanking?
4
End of
Integration?
6
Yes
No
Yes
No
Stop Integration
7
Read Integration Result
8
BIS executed
automatically