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NXP Semiconductors MPC5606S - Block Diagram

NXP Semiconductors MPC5606S
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Flash Memory
MPC5606S Microcontroller Reference Manual, Rev. 7
Freescale Semiconductor 595
Sector Erase
Single Bank: Read-While-Modify not available
Erase Suspend available (Program Suspend not available)
Software programmable Program/Erase Protection to avoid unwanted writings
Censored mode against piracy
Not usable as main Code Memory
Shadow block not available
“OTP” area in Test flash block
17.3.3 Block diagram
The flash memory macrocell contains one matrix module, composed of a single bank: Bank 0, normally
used for Code storage. No Read-While-Modify operations are possible.
The Modify operations are managed by an embedded Flash Program/Erase Controller (FPEC). Commands
to the FPEC are given through a user registers Interface.
The read data bus is 128 bits wide, while the flash memory registers are on a separate 32-bit bus.
The high voltages needed for Program/Erase operations are internally generated addressed in user memory
map.
Figure 17-26. Flash macrocell structure
64 KB
+ 16KB Test Flash
HV generator
Flash
Controller
Flash
Matrix
Registers
Program/Erase
Registers
Interface
Flash Bank 0
Interface

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